01113nam0 22002893i 450 VAN009712820140314114023.485978-02-302-0603-820140314d2010 |0itac50 baengGB|||| |||||ˆThe ‰statesman's yearbookthe politics, cultures and economies of the world2011edited by Barry TurnerLondonMacMillan2010XXXVI, 1569 p.ill.21 cm.EconomiaAnnuari statisticiVANC029069FIGBLondonVANL000015320.1Lo Stato21TurnerBarry A.VANV025876MacMillan <editore>VANV111155650Turner, Barry ArthurTurner, Barry A.VANV076954ITSOL20240719RICABIBLIOTECA DEL DIPARTIMENTO DI ECONOMIAIT-CE0106VAN03VAN0097128BIBLIOTECA DEL DIPARTIMENTO DI ECONOMIA03PREST IIIAa89 03 31449 20140314 Statesman's yearbook786300UNICAMPANIA02517oas 22008053 450 991062616350332120250922213015.02378-2250(OCoLC)61145658(CONSER) 2015202262(CKB)110978978384273(EXLCZ)9911097897838427320050726a19839999 uy aengurun|||||||||txtrdacontentcrdamediacrrdacarrierProceedings /International Test Conference[Silver Spring, Md.] :[IEEE Computer Society Press]Altoona, PA :International Test ConferenceWashington, D.C. :International Test ConferenceSome conferences also have distinctive titles.Published: Altoona, PA : International Test Conference, <1995->1089-3539 International Test ConferenceITCIEEE ... Test ConferenceIEEE International Test ConferenceProceedings of the International Test ConferenceProc.Computer storage devicesCongressesIntegrated circuitsTestingCongressesSemiconductor storage devicesTestingCongressesComputer storage devicesfast(OCoLC)fst00872634Integrated circuitsTestingfast(OCoLC)fst00975593Semiconductor storage devicesTestingfast(OCoLC)fst01112185Periodicals.fastConference papers and proceedings.fastComputer storage devicesIntegrated circuitsTestingSemiconductor storage devicesTestingComputer storage devices.Integrated circuitsTesting.Semiconductor storage devicesTesting.004004IEEE Computer SocietyInstitute of Electrical and Electronics EngineersOCLCSOCLCSOCLCSCGUOCLCQOCLCEOCLCQOCLCFOCLCODLCOCLOCLCOOCLCAU3WOCLOCLCQOCLCLCONFERENCE9910626163503321Proceedings57126UNINA