01209nam 2200361 450 991058666470332120221017114505.01-83968-230-2(CKB)4950000000721880(NjHacI)994950000000721880(EXLCZ)99495000000072188020221017d2022 uy 0engur|||||||||||txtrdacontentcrdamediacrrdacarrierRecent Developments in Atomic Force Microscopy and Raman Spectroscopy for Materials Characterization /edited by Chandra Shakher Pathak, Samir KumarLondon :IntechOpen,2022.1 online resource (274 pages) illustrations1-83968-229-9 Includes bibliographical references.Atomic force microscopyAtomic force microscopy.620.5Pathak Chandra ShakherKumar SamirNjHacINjHaclBOOK9910586664703321Recent Developments in Atomic Force Microscopy and Raman Spectroscopy for Materials Characterization2902600UNINA