01305nem 2200385Ia 450 991069689580332120080721150040.0(CKB)5470000002381919(OCoLC)234315599(EXLCZ)99547000000238191920080721d2004 ua engb|||||||||||||||||||||durcn|||||||||crdrdacontentcrdamediacrrdacarrier2004 USAID/DCHA/OFDA grants in Afghanistan[electronic resource] United States Agency for International Development[Washington, D.C.] :U.S. Agency for International Development,[2004]1 map digital, PDF fileTitle from title screen (viewed on July 14, 2008)."4/26/04."Humanitarian assistanceAfghanistanMapsMaps.lcgftHumanitarian assistanceUnited States.Bureau for Democracy, Conflict, and Humanitarian Assistance.United States.Agency for International Development.Office of Foreign Disaster Assistance.GPOGPOBOOK99106968958033212004 USAID3111536UNINA04118nam 2201213z- 450 991057687840332120220621(CKB)5720000000008391(oapen)https://directory.doabooks.org/handle/20.500.12854/84461(oapen)doab84461(EXLCZ)99572000000000839120202206d2022 |y 0engurmn|---annantxtrdacontentcrdamediacrrdacarrierOptical In-Process Measurement SystemsBaselMDPI - Multidisciplinary Digital Publishing Institute20221 online resource (194 p.)3-0365-3849-6 3-0365-3850-X Information is key, which means that measurements are key. For this reason, this book provides unique insight into state-of-the-art research works regarding optical measurement systems. Optical systems are fast and precise, and the ongoing challenge is to enable optical principles for in-process measurements. Presented within this book is a selection of promising optical measurement approaches for real-world applications.History of engineering & technologybicsscTechnology: general issuesbicsscadditive manufacturingbistaticcoal dustcoherence functioncoherence scanning interferometrycomputational shear interferometrydeep rolling processdiffraction equationdiffraction gratingdilated convolutionDoppler lidardual-aperture common-path interferometerelectrical steelexplosionexplosion pressureexplosion suppressionfast prediction timefree radicalsfringe projectiongas mixing modelinggeneralized phase shifting interferometrygrating pitchhairpinimage processingin situ measurementin-process applicationin-process measurementinterferometric distance sensorinterferometrylaser diffractionlaser material processinglaser weldingLCIlow coherence interferometrymeasurement uncertainty analysismedium voltage switchgearmeteorologymethanemetrologyMirau interferometermode-locked femtosecond lasermulticomponent diffusion analysisn/aOCToptical coherence tomographyoptical metrologyoptical path length modulationoptomechatronic systemsoscillating reference mirrorpattern recognitionprocess monitoringquality assurancequality controlradiation intensityreal-time optical instrumentationscanningsdu-netsemantic segmentationSF6 alternativesspatter detectionspeckle photographyspectral characteristicsspot compensationstructure functiontraceabilityturbulence wedgesUV-Vis spectroscopyvibration compensationwind energywind energy turbineswind lidarHistory of engineering & technologyTechnology: general issuesFischer Andreasedt222548Fischer AndreasothBOOK9910576878403321Optical In-Process Measurement Systems3035619UNINA