04477nam 2201069z- 450 991055770110332120220111(CKB)5400000000044546(oapen)https://directory.doabooks.org/handle/20.500.12854/76777(oapen)doab76777(EXLCZ)99540000000004454620202201d2021 |y 0engurmn|---annantxtrdacontentcrdamediacrrdacarrierCharacterization of Nanomaterials: Selected Papers from 6th Dresden Nanoanalysis SymposiumcBasel, SwitzerlandMDPI - Multidisciplinary Digital Publishing Institute20211 online resource (139 p.)3-0365-0756-6 3-0365-0757-4 This Special Issue "Characterization of Nanomaterials" collects nine selected papers presented at the 6th Dresden Nanoanalysis Symposium, held at Fraunhofer Institute for Ceramic Technologies and Systems in Dresden, Germany, on 31 August 2018. Following the specific motto of this annual symposium "Materials challenges-Micro- and nanoscale characterization", it covered various topics of nanoscale materials characterization along the whole value and innovation chain, from fundamental research up to industrial applications. The scope of this Special Issue is to provide an overview of the current status, recent developments and research activities in the field of nanoscale materials characterization, with a particular emphasis on future scenarios. Primarily, analytical techniques for the characterization of thin films and nanostructures are discussed, including modeling and simulation. We anticipate that this Special Issue will be accessible to a wide audience, as it explores not only methodical aspects of nanoscale materials characterization, but also materials synthesis, fabrication of devices and applications.Characterization of NanomaterialsTechnology: general issuesbicssc2D materialsAl-Ni systemAlN/Al coatingaluminum oxidecompositional depth profilingcopper oxidedegradationdopingelectrolyte-gated transistorsGa-Sn-Zn alloysgallium alloysgrain boundariesgrowth kineticshigh aspect ratio (HAR) structuresindentation failure modesintermetallic phaseslateral high aspect ratio (LHAR)leachingliquid alloyslithium-ionmagnetron sputteringmicrowave synthesismulti-level celln/ananoanalysisnanoindentation adhesionnanoparticlesnanoscale residual stress profilingnickel-manganese-cobalt oxide (NMC)oxide dissociationoxide structure analysisp-type oxide semiconductorsp-type TFTpaper transistorsphysical vapor depositionprinted electronicsRaman spectroscopyrare earth ionsrecoverrecyclingresidual stressesresistive switching memoriesSEM-EDXsilicon doped hafnium oxide (HSO) ALD depositionsilicon substrateSnO electrical propertiesthin filmsToF-SIMS 3D imagingToF-SIMS analysisupconversionwafer curvature methodzinc oxideTechnology: general issuesZschech Ehrenfriededt950028Sinclair RobertedtMartins RodrigoedtSebastiani MarcoedtSartori SabrinaedtZschech EhrenfriedothSinclair RobertothMartins RodrigoothSebastiani MarcoothSartori SabrinaothBOOK9910557701103321Characterization of Nanomaterials: Selected Papers from 6th Dresden Nanoanalysis Symposiumc3030631UNINA