01499nam 2200469 450 991055500530332120220412004729.01-119-07653-61-119-07654-41-119-07623-4(CKB)4330000000008365(MiAaPQ)EBC6683932(Au-PeEL)EBL6683932(OCoLC)1262373822(EXLCZ)99433000000000836520220412d2021 uy 0engurcnu||||||||txtrdacontentcrdamediacrrdacarrierModern characterization of electromagnetic systems and its associated metrology /Magdalena Salazar-Palma, Tapan K. Sarkar, Ming Da ZhuHoboken, New Jersey :John Wiley & Sons, Inc.,[2021]℗♭20211 online resource (723 pages)Wiley - IEEE Ser.1-119-07646-3 Includes bibliographical references and index.Wiley - IEEE Ser.Electromagnetic wavesMeasurementElectromagnetic wavesMeasurement.537.12Salazar-Palma Magdalena861617Sarkar TapanZhu Ming DaMiAaPQMiAaPQMiAaPQBOOK9910555005303321Modern Characterization of Electromagnetic Systems and Its Associated Metrology2816071UNINA