01171nam 2200361 450 991055405720332120230423074617.01-66544-464-9(CKB)4100000011977904(NjHacI)994100000011977904(EXLCZ)99410000001197790420230423d2021 uy 0engur|||||||||||txtrdacontentcrdamediacrrdacarrier2021 IEEE/ACM 6th International Workshop on Metamorphic Testing (MET) /Institute of Electrical and Electronics EngineersPiscataway :IEEE,2021.1 online resource (ix, 75 pages) illustrations (some color)1-66544-465-7 2021 IEEE/ACM 6th International Workshop on Metamorphic Testing Computer softwareTestingCongressesSoftware engineeringCongressesComputer softwareTestingSoftware engineering005.1NjHacINjHaclPROCEEDING99105540572033212021 IEEE2518023UNINA