01113nam 2200337 450 991049213750332120231213215130.01-5044-6933-X(CKB)4100000011992794(NjHacI)994100000011992794(EXLCZ)99410000001199279420231213d2008 uy 0engur|||||||||||txtrdacontentcrdamediacrrdacarrier1620-2008 - IEEE Standard for Test Methods for the Characterization of Organic Transistors and Materials /Institute of Electrical and Electronics Engineer[Place of publication not identified] :IEEE,2008.1 online resourcePeriodicalsPeriodicalsUse studiePeriodicals.Periodicals025.3432NjHacINjHaclDOCUMENT99104921375033211620-2008 - IEEE Standard for Test Methods for the Characterization of Organic Transistors and Materials2584875UNINA