03352nam 22006615 450 991048355660332120220926202949.03-030-68780-510.1007/978-3-030-68780-9(CKB)4100000011781570(MiAaPQ)EBC6501092(DE-He213)978-3-030-68780-9(PPN)253858585(EXLCZ)99410000001178157020210224d2021 u| 0engurnn|008mamaatxtrdacontentcrdamediacrrdacarrierPattern Recognition. ICPR International Workshops and Challenges Virtual Event, January 10–15, 2021, Proceedings, Part VI /edited by Alberto Del Bimbo, Rita Cucchiara, Stan Sclaroff, Giovanni Maria Farinella, Tao Mei, Marco Bertini, Hugo Jair Escalante, Roberto Vezzani1st ed. 2021.Cham :Springer International Publishing :Imprint: Springer,2021.1 online resource (XX, 821 p. 323 illus., 277 illus. in color.) Image Processing, Computer Vision, Pattern Recognition, and Graphics ;126663-030-68779-1 This 8-volumes set constitutes the refereed of the 25th International Conference on Pattern Recognition Workshops, ICPR 2020, held virtually in Milan, Italy and rescheduled to January 10 - 11, 2021 due to Covid-19 pandemic. The 416 full papers presented in these 8 volumes were carefully reviewed and selected from about 700 submissions. The 46 workshops cover a wide range of areas including machine learning, pattern analysis, healthcare, human behavior, environment, surveillance, forensics and biometrics, robotics and egovision, cultural heritage and document analysis, retrieval, and women at ICPR2020.Image Processing, Computer Vision, Pattern Recognition, and Graphics ;12666Computer visionApplication softwareArtificial intelligenceComputersComputer VisionComputer and Information Systems ApplicationsArtificial IntelligenceComputing MilieuxComputer vision.Application software.Artificial intelligence.Computers.Computer Vision.Computer and Information Systems Applications.Artificial Intelligence.Computing Milieux.006.37006.4Del Bimbo Albertoedthttp://id.loc.gov/vocabulary/relators/edtCucchiara Ritaedthttp://id.loc.gov/vocabulary/relators/edtSclaroff Stanedthttp://id.loc.gov/vocabulary/relators/edtFarinella Giovanni Mariaedthttp://id.loc.gov/vocabulary/relators/edtMei Taoedthttp://id.loc.gov/vocabulary/relators/edtBertini Marcoedthttp://id.loc.gov/vocabulary/relators/edtEscalante Hugo Jairedthttp://id.loc.gov/vocabulary/relators/edtVezzani Robertoedthttp://id.loc.gov/vocabulary/relators/edtBOOK9910483556603321Pattern Recognition. ICPR International Workshops and Challenges2808746UNINA