01410nam 2200385 450 991047890580332187-7022-111-1(CKB)4100000008736203(MiAaPQ)EBC5829253(EXLCZ)99410000000873620320190808d2019 uy 0engurcnu||||||||txtrdacontentcrdamediacrrdacarrierOn-Wafer calibration techniques enabling accurate characterization of high-performance silicon devices at the mm-wave range and beyond /Andrej RumiantsevGistrup, Denmark ;Delft, Netherlands :River Publishers,[2019]©20191 online resource (278 pages)River publishers series in electronic materials and devices87-7022-112-X River Publishers series in electronic materials and devices.SemiconductorsCharacterizationElectronic books.SemiconductorsCharacterization.621.38152Rumiantsev Andrej991364MiAaPQMiAaPQMiAaPQBOOK9910478905803321On-Wafer calibration techniques enabling accurate characterization of high-performance silicon devices at the mm-wave range and beyond2268647UNINA