02051nam 2200565 450 991046759460332120200520144314.01-5231-0206-31-62708-103-8(CKB)3880000000022013(SSID)ssj0001679803(PQKBManifestationID)16490573(PQKBTitleCode)TC0001679803(PQKBWorkID)15023273(PQKB)10251898(MiAaPQ)EBC4392496(Au-PeEL)EBL4392496(CaPaEBR)ebr11160634(OCoLC)940934393(EXLCZ)99388000000002201320160314h20152015 uy| 0engurcnu||||||||txtccrISTFA 2015 conference proceedings from the 41st International Symposium for Testing and Failure Analysis November 1-5 2015, Oregon Convention Center, Portland, Oregon, USA /organized by ISTFA/2015, Electronic Device Failure Analysis Society (EDFAS), ASM InternationalMaterials Park, Ohio :ASM International,[2015]©20151 online resource (536 pages) illustrations (some color)Cover title.1-62708-102-X ElectronicsMaterialsTestingCongressesMaterialsTestingCongressesElectronic apparatus and appliancesTestingCongressesSemiconductorsTestingCongressesElectronic books.ElectronicsMaterialsTestingMaterialsTestingElectronic apparatus and appliancesTestingSemiconductorsTestingASM International,Electronic Device Failure Analysis Society,MiAaPQMiAaPQMiAaPQBOOK9910467594603321ISTFA 2015 conference proceedings from the 41st International Symposium for Testing and Failure Analysis1978750UNINA