01302nam 2200421 450 991046696850332120200520144314.03-8325-9666-6(CKB)4340000000242940(MiAaPQ)EBC5223913(Au-PeEL)EBL5223913(CaPaEBR)ebr11539620(OCoLC)1021809289(EXLCZ)99434000000024294020180524d2014 uy 0engurcnu||||||||txtrdacontentcrdamediacrrdacarrierLeakage current and defect characterization of short channel MOSFETs /Guntrade RollBerlin :Logos Verlag Berlin,[2014]©20141 online resource (242 pages)Research at NaMLab ;23-8325-3261-7 Metal oxide semiconductor field-effect transistorsElectronic books.Metal oxide semiconductor field-effect transistors.621.3815284Roll Guntrade952672MiAaPQMiAaPQMiAaPQBOOK9910466968503321Leakage current and defect characterization of short channel MOSFETs2153839UNINA