02357nam 22005891 450 991046488830332120200520144314.03-03813-031-1(CKB)3710000000025540(EBL)1867695(SSID)ssj0001189674(PQKBManifestationID)11704373(PQKBTitleCode)TC0001189674(PQKBWorkID)11178072(PQKB)11679964(MiAaPQ)EBC1867695(Au-PeEL)EBL1867695(CaPaEBR)ebr10777887(OCoLC)607839769(EXLCZ)99371000000002554020131101d2005 uy 0engur|n|---|||||txtccrDiffusion in silicon a seven-year retrospective /editor: D. J. FisherDurnten-Zurich :Trans Tech Publications, Inc.,[2005]©20051 online resource (210 p.)Defect and Diffusion Forum ;Vol. 241Description based upon print version of record.3-908451-11-6 Diffusion in Silicon - A Seven-Year Retrospective; Table of Contents; AbstractsThis collection of abstracts of experimental and theoretical papers on the subject of diffusion in silicon is intended to complement earlier volumes (DDF153-155) which covered the previous decade's work on the same topic. The abstracts are grouped according to the diffusing species in question. The latter comprise Ag, Al, As, Au, B, Ba, Be, C, Ca, Cl, Co, Cr, Cu, Er, F, Fe, Ge, H, He, Hf, In, Ir, K, Mg, Mn, Mo, N, Na, Nb, Ni, O, P, Pb, Pt, Rb, Sb, Se, Si, SiH3, Sn, Ti, V, Yb and Zn with regard to bulk diffusion, Ag, Au, Ba, Cl, Cu, Er, F, Ga, Ge, In, O, Pb, Sb, Si, SiH3, Sn and Y with regard tDiffusion and defect data.Pt. A,Defect and diffusion forum ;v. 241.SiliconSiliconAnalysisDiffusionElectronic books.Silicon.SiliconAnalysis.Diffusion.620.193Fisher D. J727312MiAaPQMiAaPQMiAaPQBOOK9910464888303321Diffusion in silicon2183768UNINA