05384nam 2200661 450 991046384980332120200520144314.01-118-78739-01-118-78725-0(CKB)2670000000523084(EBL)1629173(SSID)ssj0001166076(PQKBManifestationID)11751579(PQKBTitleCode)TC0001166076(PQKBWorkID)11118216(PQKB)11294503(MiAaPQ)EBC1629173(CaSebORM)9781118787397(Au-PeEL)EBL1629173(CaPaEBR)ebr10837612(CaONFJC)MIL573950(OCoLC)874161575(EXLCZ)99267000000052308420131030h20142014 uy| 0engurunu|||||txtccrPractical reverse engineering x86, x64, ARM, Windows Kernel, reversing tools, and obfuscation /Bruce Dang, Alexandre Gazet, Elias Bachaalany ; with contributions from Sébastien Josse1st editionIndianapolis, IN :John Wiley and Sons,[2014]©20141 online resource (383 p.)Description based upon print version of record.1-118-78731-5 Includes bibliographical references and index.Cover; Title Page; Copyright; Contents; Chapter 1 x86 and x64; Register Set and Data Types; Instruction Set; Syntax; Data Movement; Exercise; Arithmetic Operations; Stack Operations and Function Invocation; Exercises; Control Flow; System Mechanism; Address Translation; Interrupts and Exceptions; Walk-Through; Exercises; x64; Register Set and Data Types; Data Movement; Canonical Address; Function Invocation; Exercises; Chapter 2 ARM; Basic Features; Data Types and Registers; System-Level Controls and Settings; Introduction to the Instruction Set; Loading and Storing Data; LDR and STROther Usage for LDRLDM and STM; PUSH and POP; Functions and Function Invocation; Arithmetic Operations; Branching and Conditional Execution; Thumb State; Switch-Case; Miscellaneous; Just-in-Time and Self-Modifying Code; Synchronization Primitives; System Services and Mechanisms; Instructions; Walk-Through; Next Steps; Exercises; Chapter 3 The Windows Kernel; Windows Fundamentals; Memory Layout; Processor Initialization; System Calls; Interrupt Request Level; Pool Memory; Memory Descriptor Lists; Processes and Threads; Execution Context; Kernel Synchronization Primitives; ListsImplementation Details Walk-Through; Exercises; Asynchronous and Ad-Hoc Execution; System Threads; Work Items; Asynchronous Procedure Calls; Deferred Procedure Calls; Timers; Process and Thread Callbacks; Completion Routines; I/O Request Packets; Structure of a Driver; Entry Points; Driver and Device Objects; IRP Handling; A Common Mechanism for User-Kernel Communication; Miscellaneous System Mechanisms; Walk-Throughs; An x86 Rootkit; An x64 Rootkit; Next Steps; Exercises; Building Confidence and Solidifying Your Knowledge; Investigating and Extending Your KnowledgeAnalysis of Real-Life Drivers Chapter 4 Debugging and Automation; The Debugging Tools and Basic Commands; Setting the Symbol Path; Debugger Windows; Evaluating Expressions; Process Control and Debut Events; Registers, Memory, and Symbols; Breakpoints; Inspecting Processes and Modules; Miscellaneous Commands; Scripting with the Debugging Tools; Pseudo-Registers; Aliases; Language; Script Files; Using Scripts Like Functions; Example Debug Scripts; Using the SDK; Concepts; Writing Debugging Tools Extensions; Useful Extensions, Tools, and Resources; Chapter 5 ObfuscationA Survey of Obfuscation Techniques The Nature of Obfuscation: A Motivating Example; Data-Based Obfuscations; Control-Based Obfuscation; Simultaneous Control-Flow and Data-Flow Obfuscation; Achieving Security by Obscurity; A Survey of Deobfuscation Techniques; The Nature of Deobfuscation: Transformation Inversion; Deobfuscation Tools; Practical Deobfuscation; Case Study; First Impressions; Analyzing Handlers Semantics; Symbolic Execution; Solving the Challenge; Final Thoughts; Exercises; Appendix Sample Names and Corresponding SHA1 Hashes; IndexAnalyzing how hacks are done, so as to stop them in the future Reverse engineering is the process of analyzing hardware or software and understanding it, without having access to the source code or design documents. Hackers are able to reverse engineer systems and exploit what they find with scary results. Now the good guys can use the same tools to thwart these threats. Practical Reverse Engineering goes under the hood of reverse engineering for security analysts, security engineers, and system programmers, so they can learn how to use these same processes to stop hackeReverse engineeringElectronic books.Reverse engineering.005.8Dang Bruce927069Gazet Alexandre927070Bachaalany Elias927071Josse Sébastien927072MiAaPQMiAaPQMiAaPQBOOK9910463849803321Practical reverse engineering2082901UNINA05609nam 2200661Ia 450 991083031800332120230617040632.01-280-85401-497866108540113-527-60666-13-527-60687-4(CKB)1000000000376964(EBL)481681(OCoLC)70114976(SSID)ssj0000207934(PQKBManifestationID)11199015(PQKBTitleCode)TC0000207934(PQKBWorkID)10238819(PQKB)10357020(MiAaPQ)EBC481681(EXLCZ)99100000000037696420060908d2005 fy 0engur|n|---|||||txtccrNanoscale calibration standards and methods[electronic resource] dimensional and related measurements in the micro- and nanometer range /edited by Günter Wilkening, Ludger KoendersWeinheim ;[Chichester?] Wiley-VCHc20051 online resource (543 p.)Conference proceedings.3-527-40502-X Includes bibliographical references and index.Nanoscale Calibration Standards and Methods; Contents; List of Contributors; Part I Instrumentation - Overview; 1 Metrological Scanning Probe Microscopes - Instruments for Dimensional Nanometrology; 1.1 Introduction; 1.2 High-Resolution Probing Systems; 1.2.1 Sensor Objective with Beam Deflection Detection; 1.2.2 Sensor Objective with Piezolever Module; 1.2.3 Sensor Objective with Tuning Fork Module; 1.2.4 Sensor Head for Combined Scanning Probe and Interference Microscopy; 1.3 Metrology Systems Based on Scanning Probe Microscopes; 1.3.1 Scanning Force Microscopes of Type Veritekt1.3.2 Metrological Large Range Scanning Force Microscope1.4 Summary; Acknowledgments; References; 2 Nanometrology at the IMGC; 2.1 Introduction; 2.2 Surface Metrology; 2.2.1 Scanning Probe Microscopy; 2.2.2 Optical Diffractometry; 2.2.3 Stylus Profilometry; 2.3 Atomic Scale Metrology; 2.3.1 Lattice Parameter of Silicon; 2.3.2 Combined Optical and X-Ray Interferometry (COXI); 2.4 Phase-Contrast Topograpy; 2.4.1 Detection of Small Lattice Strain; 2.4.2 Phase-Contrast Imaging; 2.5 Nanobalance; 2.6 Conclusions; References; 3 Metrological Applications of X-ray Interferometry; 3.1 Introduction3.2 Measurement of Non-linearity in Optical Interferometers3.3 Combined Optical and X-ray Interferometry; 3.4 Measurement of Small Angles; 3.5 X-ray Interferometry and Scanning Probe Microscopy; 3.6 Conclusions; References; Part II Instrumentation - Long-range Scanning Probe Microscopes; 4 Advances in Traceable Nanometrology with the Nanopositioning and Nanomeasuring Machine; 4.1 Introduction; 4.2 Design and Operation; 4.3 Uncertainty Budget; 4.4 Focus Sensor; 4.5 Measuring Opportunities and Performance with Focus Sensor; 4.6 Focus Probe with SFM Cantilever; 4.7 Conclusion; AcknowledgementsReferences5 Coordinate Measurements in Microsystems by Using AFM-Probing: Problems and Solutions; 5.1 Introduction; 5.2 Realizing CMMs for Microsystems; 5.3 Problems and Solutions; 5.3.1 Dynamics of Positioning System; 5.3.2 CMM: One-Millimeter Scan; 5.3.3 Measuring Strategies; 5.4 Conclusion and Outlook; References; 6 Metrological Large Range Scanning Force Microscope Applicable for Traceable Calibration of Surface Textures; 6.1 Introduction; 6.2 Instrumentation; 6.2.1 Principle; 6.2.2 Metrological Properties; 6.2.3 Traceability; 6.2.4 Specially Designed Features6.3 Measurement Result of a 2D-Grating Standard6.3.1 Measurement Strategy; 6.3.2 Data Evaluation; 6.3.3 Measurement Result of the Mean Pitch Value; 6.3.4 Measurement of the Local Pitch Variation; 6.4 A Selected Measurement Result of a Microroughness Standard; 6.4.1 Measurement Result of a Glass Flatness Standard; 6.4.2 Measurement of a PTB Microroughness Standard; 6.4.3 Comparison of the Roughness Measurement Results Derived from SFM and Stylus Instruments Using Gaussian Filter; 6.4.4 Comparison Using Morphological Filters; 6.4.5 Evaluation Results Using PTB Reference Software6.5 Outlook and ConclusionThe quantitative determination of the properties of micro- and nanostructures is essential in research and development. It is also a prerequisite in process control and quality assurance in industry. The knowledge of the geometrical dimensions of structures in most cases is the base, to which other physical and chemical properties are linked. Quantitative measurements require reliable and stable instruments, suitable measurement procedures as well as appropriate calibration artefacts and methods. The seminar ""NanoScale 2004"" (6th Seminar on Quantitative Microscopy and 2nd Seminar on NanoscalMicrostructureMeasurementCongressesNanostructured materialsMeasurementCongressesScientific apparatus and instrumentsCalibrationCongressesStereologyCongressesMicrostructureMeasurementNanostructured materialsMeasurementScientific apparatus and instrumentsCalibrationStereology620.50287Koenders Ludger1619525Wilkening Günter1619526MiAaPQMiAaPQMiAaPQBOOK9910830318003321Nanoscale calibration standards and methods3951818UNINA