02860nam 22005651 450 991046278100332120200520144314.03-03813-208-X(CKB)2670000000348181(EBL)1869212(SSID)ssj0001127799(PQKBManifestationID)11717880(PQKBTitleCode)TC0001127799(PQKBWorkID)11151998(PQKB)11395528(MiAaPQ)EBC1869212(Au-PeEL)EBL1869212(CaPaEBR)ebr10777856(OCoLC)897070548(EXLCZ)99267000000034818120131101d2008 uy 0engurcnu||||||||txtccrDefects and diffusion in semiconductorsXI an annual retrospective /D.J. FisherStafa-Zuerich, Switzerland :TTP, Trans Tech Publications,[2008]©20081 online resource (160 p.)Defects and diffusion forum,1012-0386 ;v. 282Description based upon print version of record.3-908451-63-9 Includes bibliographical references and indexes.Defects and Diffusion in Semicondutors, 2009; Table of Contents; Structural and Electron-Hopping Studies of Pr and Nd Substituted La2/3Ba1/3MnO3 Manganites; Recrystallization Annealing of Cold Rolled 9Cr 1Mo Ferritic Steel Containing Silicon; Quantitative Concept for Morphological Stability Analysis of Liquid-Solid Interface in Rapid Solidification of Dilute Binary Alloys; Studies of the Spin Hamiltonian Parameters for NiX2 and CdX2:Ni2+ (X=Cl, Br); Abstracts; Keywords Index; Authors IndexThis eleventh volume in the series covering the latest results in the field includes abstracts of papers which have appeared since the publication of Annual Retrospective X (Volume 272). As well as the 295 metals abstracts, the issue includes - in line with the new editorial policy of including original papers on all of the major material groups: ""Structural and Electron-Hopping Studies of Pr- and Nd-Substituted La2/3Ba1/3MnO3 Manganites"" (H.Abdullah and S.A.Halim), ""Recrystallization Annealing of Cold-Rolled 9Cr-1Mo Ferritic Steel Containing Silicon"" (M.N.Mungole, M.Surender, R.BalasubramDiffusion and defect data.Pt. A,Defect and diffusion forum ;v. 282.SemiconductorsDefectsSemiconductorsDiffusionElectronic books.SemiconductorsDefects.SemiconductorsDiffusion.Fisher D. J727312MiAaPQMiAaPQMiAaPQBOOK9910462781003321Defects and diffusion in semiconductors1918009UNINA