05279nam 2200733 a 450 991045928550332120200520144314.01-282-45158-897866124515841-84719-727-2(CKB)2670000000036110(EBL)951158(OCoLC)797915649(SSID)ssj0000404051(PQKBManifestationID)12146903(PQKBTitleCode)TC0000404051(PQKBWorkID)10437898(PQKB)11031784(MiAaPQ)EBC951158(CaSebORM)9781847197269(PPN)228040159(Au-PeEL)EBL951158(CaPaEBR)ebr10430360(CaONFJC)MIL245158(EXLCZ)99267000000003611020101217d2009 uy 0engur|n|---|||||txtccrADempiere 3.4 ERP solutions[electronic resource] design configure, and implement a robust enterprise resource planning system in your organization by using ADempiere /Bayu Cahya Pamungkas1st editionBirmingham, U.K. Packt Pub.20091 online resource (460 p.)From technologies to solutionsIncludes index.1-84719-726-4 Cover; Copyright; Credits; About the Author; About the Reviewers; Table of Contents; Preface; Chapter 1: ADempiere Installation; ADempiere hardware and operating system requirements; Installing the Sun Java Development Kit (JDK); Obtaining JDK/JRE; Installing JDK/JRE; JDK installation on the ADempiere server computer; JRE installation on the ADempiere client computer; Configuring Java system variables and the Windows path; Verifying system variables and the Windows path; Installing databases; Obtaining PostgreSQL databases; Installing PostgreSQL databases; Adding the PostgreSQL pathVerifying the additional PostgreSQL pathConfiguring PostgreSQL; Modifying the client authentication configuration file; Verifying the PostgreSQL configuration file; Configuring the firewall to allow database connections; Installing ADempiere on the server side; Downloading the ADempiere core installation files; Downloading the latest ADempiere patch files; Obtaining the ADempiere application patch files; Obtaining the ADempiere database migration script; Verifying the ADempiere binary files; Extracting the ADempiere core installation files; Applying the ADempiere application patch filesCreating an ADempiere PostgreSQL databaseCreating a PostgreSQL new login role; Creating an ADempiere database; Configuring the ADempiere server; Importing the initial ADempiere database; Applying the database migration script; ADempiere server memory management; Starting up the ADempiere application server; Installing ADempiere on the client side; Web Start client installation; Verifying the ADempiere client installation; Reading the ADempiere 3.4.2s release notes; Summary; Chapter 2: Exploring the ADempiere Client and Performing Tasks; The Connection aspect of ADempiereChecking the ADempiere client versionThe predefined user ID and password; Understanding the Client and System users; Changing our ADempiere server connection; Which ADempiere server are we working on?; Managing ADempiere client; Working with the Menu; Menu Icon; Accessing menus; Menu Lookup and creating shortcuts; User preferences; More on the Cache Window option; Parts of the ADempiere window; More on Record Info; OK or Cancel button in the window; Maintaining a log of data changes; Standard window fields; Client and Organization fields; Active checkbox fields; Performing tasksData managementData navigation; Other tasks; More on Lookup records; Setting additional search criteria; More examples on the use of Zoom Across; Field context menu; Zoom; ReQuery; Value preference; Summary; Chapter 3: Exploring Company Structures and the Initial Client Setup; Sample apparel company structure; ADempiere company structures; Managing the Chart of accounts template; Exploring the accounting format template files; Account editor tools; Creating a new ADempiere client; Reviewing your new ADempiere client creation; Setting additional organizations; Creating the organization typeCreating an additional organizationDesign, configure, and implement a robust enterprise resource planning system in your organization using ADempiereFrom technologies to solutions.Management information systemsInformation resources managementBusiness planningComputer network resourcesOpen source softwareElectronic books.Management information systems.Information resources management.Business planningComputer network resources.Open source software.005.712762Pamungkas Bayu Cahya993777MiAaPQMiAaPQMiAaPQBOOK9910459285503321ADempiere 3.4 ERP solutions2275469UNINA04645nam 2200697 a 450 991083097610332120240219135907.01-280-65470-897866106547030-470-36250-20-471-74909-50-471-74908-710.1002/0471749095(CKB)1000000000355036(EBL)275904(SSID)ssj0000244006(PQKBManifestationID)11188932(PQKBTitleCode)TC0000244006(PQKBWorkID)10164982(PQKB)11507748(MiAaPQ)EBC275904(CaBNVSL)mat05237928(IDAMS)0b00006481095e09(IEEE)5237928(OCoLC)163140623(JP-MeL)3000111653(Au-PeEL)EBL275904(CaPaEBR)ebr10305091(CaONFJC)MIL65470(PPN)19037747X(EXLCZ)99100000000035503620050420d2006 uy 0engur|n|---|||||txtccrSemiconductor material and device characterization[electronic resource] /Dieter K. Schroder3rd ed.[Piscataway, NJ] IEEE Press ;Hoboken, N.J. Wileyc20061 online resource (799 p.)"Wiley-Interscience."0-471-73906-5 Includes bibliographical references and index.Resistivity -- Carrier and doping density -- Contact resistance and Schottky barriers -- Series resistance, channel length and width, and threshold voltage -- Defects -- Oxide and interface trapped charges, oxide thickness -- Carrier lifetimes -- Mobility -- Charge-based and probe characterization -- Optical characterization -- Chemical and physical characterization -- Reliability and failure analysis.This Third Edition updates a landmark text with the latest findings The Third Edition of the internationally lauded Semiconductor Material and Device Characterization brings the text fully up-to-date with the latest developments in the field and includes new pedagogical tools to assist readers. Not only does the Third Edition set forth all the latest measurement techniques, but it also examines new interpretations and new applications of existing techniques. Semiconductor Material and Device Characterization remains the sole text dedicated to characterization techniques for measuring semiconductor materials and devices. Coverage includes the full range of electrical and optical characterization methods, including the more specialized chemical and physical techniques. Readers familiar with the previous two editions will discover a thoroughly revised and updated Third Edition, including: . Updated and revised figures and examples reflecting the most current data and information. 260 new references offering access to the latest research and discussions in specialized topics. New problems and review questions at the end of each chapter to test readers' understanding of the material In addition, readers will find fully updated and revised sections in each chapter. Plus, two new chapters have been added: . Charge-Based and Probe Characterization introduces charge-based measurement and Kelvin probes. This chapter also examines probe-based measurements, including scanning capacitance, scanning Kelvin force, scanning spreading resistance, and ballistic electron emission microscopy.. Reliability and Failure Analysis examines failure times and distribution functions, and discusses electromigration, hot carriers, gate oxide integrity, negative bias temperature instability, stress-induced leakage current, and electrostatic discharge. Written by an internationally recognized authority in the field, Semiconductor Material and Device Characterization remains essential reading for graduate students as well as for professionals working in the field of semiconductor devices and materials. An Instructor's Manual presenting detailed solutions to all the problems in the book is available from the Wiley editorial department.SemiconductorsSemiconductorsTestingSemiconductors.SemiconductorsTesting.621.3815/2549.8njb/09621.3815/2njb/09Schroder Dieter K324644MiAaPQMiAaPQMiAaPQBOOK9910830976103321Semiconductor material and device characterization767613UNINA