03470nam 2200637 450 991045876800332120200520144314.01-60783-984-9(CKB)2670000000047203(EBL)587849(OCoLC)670411566(SSID)ssj0000416891(PQKBManifestationID)12139589(PQKBTitleCode)TC0000416891(PQKBWorkID)10436916(PQKB)11223683(MiAaPQ)EBC587849(Au-PeEL)EBL587849(CaPaEBR)ebr10421850(CaBNVSL)mat09106079(IEEE)9106079(EXLCZ)99267000000004720320200729d2010 uy engur|n|---|||||txtccrAn engineer's guide to automated testing of high-speed interfaces /José Moreira, Hubert WerkmannBoston :Artech House,©2010.[Piscataqay, New Jersey] :IEEE Xplore,[2010]1 online resource (590 p.)Artech House microwave libraryDescription based upon print version of record.1-60783-983-0 Includes bibliographical references and index.An Engineer's Guide to Automated Testing of High-Speed Interfaces; Contents; Preface; Acknowledgments; 1 Introduction; 2 High-Speed Digital BasicsThis; 3 High-Speed Interface Standards; 4 ATE Instrumentation for DigitalApplications; 5 Tests and Measurements; 6 Production Testing; 7 Support Instrumentation; 8 Test Fixture Design; 9 Advanced ATE Topics; A Introduction to the Gaussian Distribution and Analytical Computation of the BER; B The Dual Dirac Model and RJ/DJ Separation; C Pseudo-Random Bit Sequences and Other Data Patterns; D Coding, Scrambling, Disparity,and CRCE Time Domain Reflectometry andTime Domain Transmission(TDR/TDT)F S-Parameters; G Engineering CAD Tools; H Test Fixture Evaluation andCharacterization; I Jitter Injection Calibration; About the Authors; IndexProviding a complete introduction to the state-of-the-art in high-speed digital testing with automated test equipment (ATE), this practical resource is the first book to focus exclusively on this increasingly important topic. Featuring clear examples, this one-stop reference covers all critical aspects of the subject, from high-speed digital basics, ATE instrumentation for digital applications, and test and measurements, to production testing, support instrumentation and text fixture design. This in-depth volume also discusses advanced ATE topics, such as multiplexing of ATE pin channels and testing of high-speed bi-directional interfaces with fly-by approaches.Publisher abstract.Artech House microwave library.Automated testing of high-speed interfacesVery high speed integrated circuitsAutomatic test equipmentElectronic books.Very high speed integrated circuits.Automatic test equipment.621.381548Moreira José1975-771266Werkmann Hubert771267CaBNVSLCaBNVSLCaBNVSLBOOK9910458768003321Engineer’s guide to automated testing of high-speed interfaces1573799UNINA