02631nam 2200553 a 450 991045867390332120170815145434.01-907747-89-3(CKB)2560000000050276(EBL)677902(OCoLC)703156093(SSID)ssj0000474604(PQKBManifestationID)12164730(PQKBTitleCode)TC0000474604(PQKBWorkID)10454569(PQKB)11291738(MiAaPQ)EBC677902(EXLCZ)99256000000005027620040608d2004 uy 0engur|n|---|||||txtccrX-ray and electron diffraction studies in materials science[electronic resource] /D.J. DysonLondon Maney for the Institute of Materials, Minerals, and Miningc20041 online resource (376 p.)Description based upon print version of record.1-902653-74-2 Includes bibliographical references and index.Contents; INDEX; Foreword; REAL SPACE; CRYSTAL CHEMISTRY; THE INTENSITY OF DIFFRACTION; THE STEREOGRAPHIC PROJECTION; INSTRUMENT CONSIDERATIONS; LINE PROFILES; dS AND IS - PHASE IDENTIFICATION; QUANTITATIVE ANALYSIS; CRYSTALLITE SIZE ANALYSIS; THIN LAYERS; CRYSTALLOGRAPHIC TEXTURE; ELECTRON DIFFRACTION AND ITS RELATION TO XRD; APPENDIX - lA; APPENDIX - IBX-ray diffraction was first applied almost a century ago. The subsequent development of the technique and its application across industry and academia to physical, chemical and biological problems has made it an important tool in the armoury of the analyst. Much of he early work developed the basic theory and much of this is still relevant today. These early years saw the publication of some extremely good texts on the subject. Much of what is presented in these is still applicable; many of them however are no longer in print. More recent times have seen the emergence of diffractometry an contElectronsDiffractionX-raysCrystallographyElectronic books.ElectronsDiffraction.X-rays.Crystallography.620.11295Dyson D. J(David John)19732Institute of Materials, Minerals, and Mining.MiAaPQMiAaPQMiAaPQBOOK9910458673903321X-ray and electron diffraction studies in materials science1939260UNINA