04220nam 2200685 a 450 991045505220332120200520144314.01-282-42609-597866124260940-226-02918-210.7208/9780226029184(CKB)1000000000799096(EBL)471828(OCoLC)464690524(SSID)ssj0000335379(PQKBManifestationID)11257623(PQKBTitleCode)TC0000335379(PQKBWorkID)10272681(PQKB)10865447(StDuBDS)EDZ0000115674(MiAaPQ)EBC471828(DE-B1597)524739(OCoLC)1086469142(DE-B1597)9780226029184(Au-PeEL)EBL471828(CaPaEBR)ebr10343432(CaONFJC)MIL242609(EXLCZ)99100000000079909620080421d2009 uy 0engur|n|---|||||txtccrBringing in the future[electronic resource] strategies for farsightedness and sustainability in developing countries /William AscherChicago University of Chicago Press20091 online resource (343 p.)Description based upon print version of record.0-226-02917-4 0-226-02916-6 Includes bibliographical references (p. [273]-297) and index.Frontmatter -- Contents -- List of Tables -- Preface -- Acknowledgments -- 1. The Challenge of Farsightedness -- 2. The Root Causes of Shortsightedness and Their Manifestations in Developing Countries -- 3. Gaining Traction to Overcome Obstacles to Farsightedness -- 4. Creating and Rescheduling Tangible Benefits and Costs -- 5. Creating and Rescheduling Social and Psychological Rewards -- 6. Realigning Performance Evaluation -- 7. Self-Restraint Instruments -- 8. Analytic Exercises -- 9. Deepening Problem Definitions -- 10. Design Dimensions of Communicating Farsighted Appeals -- 11. The Triple Appeal Principle -- 12. Managing Heuristics -- 13. Empowering and Insulating the Farsighted Leader -- 14. Structuring Decision-Making Processes -- 15. Conclusions -- Notes -- References -- IndexHumans are plagued by shortsighted thinking, preferring to put off work on complex, deep-seated, or difficult problems in favor of quick-fix solutions to immediate needs. When short-term thinking is applied to economic development, especially in fragile nations, the results-corruption, waste, and faulty planning-are often disastrous. In Bringing in the Future, William Ascher draws on the latest research from psychology, economics, institutional design, and legal theory to suggest strategies to overcome powerful obstacles to long-term planning in developing countries. Drawing on cases from Africa, Asia, and Latin America, Ascher applies strategies such as the creation and scheduling of tangible and intangible rewards, cognitive exercises to increase the understanding of longer-term consequences, self-restraint mechanisms to protect long-term commitments and enhance credibility, and restructuring policy-making processes to permit greater influence of long-term considerations. Featuring theoretically informed research findings and sound policy examples, this volume will assist policy makers, activists, and scholars seeking to understand how the vagaries of human behavior affect international development. Sustainable developmentDeveloping countriesNatural resourcesDeveloping countriesManagementEconomic forecastingDeveloping countriesDeveloping countriesEconomic conditionsElectronic books.Sustainable developmentNatural resourcesManagement.Economic forecasting338.9/27091724Ascher William896916MiAaPQMiAaPQMiAaPQBOOK9910455052203321Bringing in the future2004128UNINA06863nam 22008535 450 991013980670332120251119190841.03-540-45850-610.1007/3-540-45850-6(CKB)1000000000778086(SSID)ssj0000325057(PQKBManifestationID)11230894(PQKBTitleCode)TC0000325057(PQKBWorkID)10319721(PQKB)10218430(DE-He213)978-3-540-45850-0(MiAaPQ)EBC3072042(PPN)155236539(EXLCZ)99100000000077808620100715d2002 u| 0engurnn#008mamaatxtccrNanoscale Spectroscopy and Its Applications to Semiconductor Research /edited by Y. Watanabe, S. Heun, G. Salviati, N. Yamamoto1st ed. 2002.Berlin, Heidelberg :Springer Berlin Heidelberg :Imprint: Springer,2002.1 online resource (XV, 308 p.)Lecture Notes in Physics,0075-8450 ;588Bibliographic Level Mode of Issuance: Monograph3-540-43312-0 Includes bibliographical references and index.Spectro-microscopy by TEM-SEM -- Determination of Nanosize Particle Distribution by Low Frequency Raman Scattering: Comparison to Electron Microscopy -- Development of Cathodoluminescence (CL) for Semiconductor Research, Part I: TEM-CL Study of Microstructures and Defects in Semiconductor Epilayers -- Development of CL for Semiconductor Research, Part II: Cathodoluminescence Study of Semiconductor Nanoparticles and Nanostructures Using Low-Electron-Beam Energies -- Development of CL for Semiconductor Research, Part III: Study of Degradation Mechanisms in Compound Semiconductor-Based Devices by SEM-CL -- Microcharacterization of Conformal GaAs on Si Layers by Spatially Resolved Optical Techniques -- Strain Analysis in Submicron Electron Devices by Convergent Beam Electron Diffraction -- Synchrotron Radiation X-ray Microscopy Based on Zone Plate Optics -- Long-Term Oxidation Behaviour of Lead Sulfide Surfaces -- Cross-Sectional Photoemission Spectromicroscopy of Semiconductor Heterostructures -- Surface Imaging Using Electrons Excited by Metastable-Atom Impacts -- Application of Photoemission Electron Microscopy to Magnetic Domain Imaging -- Photoelectron Spectroscopy with a Photoemission Electron Microscope -- X-ray Photoemission and Low-Energy Electron Microscope -- Application of Imaging-Type Photoelectron Spectromicroscopy to Solid-State Physics -- Scanning Near-Field Optical Spectroscopy of Quantum-Confined Semiconductor Nanostructures -- Novel Tuning Fork Sensor for Low-Temperature Near-Field Spectroscopy -- Manipulating, Reacting, and Constructing Single Molecules with a Scanning Tunneling Microscope Tip -- Electron-Beam-Induced Decomposition of SiO2 Overlay on Si in STM Nanolithography -- Direct Imaging of InGaAs Quantum Dot States by Scanning Tunneling Spectroscopy -- Growth and Characterization of Ge Nanostructures on Si(111) -- Imaging of Zero-Dimensional States in Semiconductor Nanostructures Using Scanning Tunneling Microscopy -- Electronic-Excitation-Induced Enhancement in Metallicity on HOPG and Si Surfaces: In Situ STM/STS Studies -- Electronic Properties of Polycrystalline and Amorphous WO3 Investigated with Scanning Tunnelling Spectroscopy -- Probing of Electronic Transitions with Atomic-Scale Spatial Resolution in Semiconductor Quantum Well Structures -- Scanning Tunneling Microscope-Induced Light Emission from Nanoscale Structures.Fabrication technologies for nanostructured devices have be- en developed recently, and the electrical and optical pro- perties of such nanostructures are a subject of advanced re- search. This book describes the different approaches to spectroscopic microscopy, i.e., electron beam probe spec- troscopy, spectroscopic photoelectron microscopy, and scan- ning probe spectroscopy. It will be useful as a compact source of reference for the experienced researcher, taking into account at the same time the needs of postgraduate stu- dents and nonspecialist researchers by using a tutorial ap- proach throughout. Fabrication technologies for nano-structured devices have been developed recently, and the electrical and optical properties of such nonostructures are a subject of advanced research. This book describes the different approaches to spectroscopic microscopy, that is, Electron Beam Probe Spectroscopy, Spectroscopic Photoelectron Microscopy, and Scanning Probe Spectroscopy. It will be useful as a compact source of reference for the experienced reseracher,taking at the same time into account the needs of post graduate students and nonspecialist researchers by using a tutorial approach throughout.Lecture Notes in Physics,0075-8450 ;588NanotechnologyOptical materialsElectronicsMaterialsSolid state physicsSpectrum analysisMicroscopyPhysical measurementsMeasurementNanotechnologyhttps://scigraph.springernature.com/ontologies/product-market-codes/Z14000Optical and Electronic Materialshttps://scigraph.springernature.com/ontologies/product-market-codes/Z12000Solid State Physicshttps://scigraph.springernature.com/ontologies/product-market-codes/P25013Spectroscopy and Microscopyhttps://scigraph.springernature.com/ontologies/product-market-codes/P31090Measurement Science and Instrumentationhttps://scigraph.springernature.com/ontologies/product-market-codes/P31040Nanotechnology.Optical materials.ElectronicsMaterials.Solid state physics.Spectrum analysis.Microscopy.Physical measurements.Measurement.Nanotechnology.Optical and Electronic Materials.Solid State Physics.Spectroscopy and Microscopy.Measurement Science and Instrumentation.621.3815/2Watanabe Yedthttp://id.loc.gov/vocabulary/relators/edtHeun Sedthttp://id.loc.gov/vocabulary/relators/edtSalviati G(Giancarlo),edthttp://id.loc.gov/vocabulary/relators/edtYamamoto Nedthttp://id.loc.gov/vocabulary/relators/edtMiAaPQMiAaPQMiAaPQBOOK9910139806703321Nanoscale spectroscopy and its applications to semiconductor research377459UNINA