05340nam 2200685 a 450 991045068230332120210426175550.01-281-17213-897866111721380-08-055757-0(UkCvUL)(CKB)1000000000413528(UkCvUL)(EBL)330238(UkCvUL)(OCoLC)469642776(UkCvUL)(SSID)ssj0000078548(UkCvUL)(PQKBManifestationID)11188499(UkCvUL)(PQKBTitleCode)TC0000078548(UkCvUL)(PQKBWorkID)10066583(UkCvUL)(PQKB)11563907(UkCvUL)(MiAaPQ)EBC330238(UkCvUL)(CaSebORM)9780123742490(UkCvUL)991000000000413528(MiAaPQ)EBC330238(Au-PeEL)EBL330238(CaPaEBR)ebr10209706(CaONFJC)MIL117213(OCoLC)469642776(EXLCZ)99100000000041352820070924d2008 uy 0engurunu|||||txtccrVHDL-2008[electronic resource] just the new stuff /Peter J. Ashenden, Jim Lewis1st editionAmsterdam ;Boston Elsevier/Morgan Kaufmannc20081 online resource (255 p.)The Morgan Kaufmann series in systems on siliconIncludes index.0-12-374249-8 Front Cover; VHDL-2008: Just the New Stuff; Copyright Page; Contents; Preface; Chapter 1. Enhanced Generics; 1.1 Generic Types; 1.2 Generic Lists in Packages; 1.3 Local Packages; 1.4 Generic Lists in Subprograms; 1.5 Generic Subprograms; 1.6 Generic Packages; 1.7 Use Case: Generic Memories; Chapter 2. Other Major Features; 2.1 External Names; 2.2 Force and Release; 2.3 Context Declarations; 2.4 Integrated PSL; 2.5 IP Encryption; 2.6 VHDL Procedural Interface (VHPI); Chapter 3. Type System Changes; 3.1 Unconstrained Element Types; 3.2 Resolved Elements; Chapter 4. New and Changed Operations4.1 Array/Scalar Logical Operations 4.2 Array/Scalar Addition Operators; 4.3 Logical Reduction Operators; 4.4 Condition Operator; 4.5 Matching Relational Operators; 4.6 Maximum and Minimum; 4.7 Mod and Rem for Physical Types; 4.8 Shift Operations; 4.9 Strength Reduction and 'X' Detection; Chapter 5. New and Changed Statements; 5.1 Conditional and Selected Assignments; 5.2 Matching Case Statements; 5.3 If and Case Generate; Chapter 6. Modeling Enhancements; 6.1 Signal Expressions in Port Maps; 6.2 All Signals in Sensitivity List; 6.3 Reading Out-Mode Ports and Parameters6.4 Slices in Aggregates 6.5 Bit-String Literals; Chapter 7. Improved I/O; 7.1 The To_string Functions; 7.2 The Justify Function; 7.3 Newline Formatting; 7.4 Read and Write Operations; 7.5 The Tee Procedure; 7.6 The Flush Procedure; Chapter 8. Standard Packages; 8.1 The Std_logic_1164 Package; 8.2 The Numeric_bit and Numeric_std Packages; 8.3 The Numeric Unsigned Packages; 8.4 The Fixed-Point Math Packages; 8.5 The Floating-Point Math Packages; 8.6 The Standard Package; 8.7 The Env Package; 8.8 Operator Overloading Summary; 8.9 Conversion Function Summary8.10 Strength Reduction Function Summary Chapter 9. Miscellaneous Changes; 9.1 Referencing Generics in Generic Lists; 9.2 Function Return Subtype; 9.3 Qualified Expression Subtype; 9.4 Type Conversions; 9.5 Case Expression Subtype; 9.6 Subtypes for Port and Parameter Actuals; 9.7 Static Composite Expressions; 9.8 Static Ranges; 9.9 Use Clauses, Types, and Operations; 9.10 Hiding of Implicit Operations; 9.11 Multidimensional Array Alias; 9.12 Others in Aggregates; 9.13 Attribute Specifications in Package Bodies; 9.14 Attribute Specification for Overloaded Subprograms9.15 Integer Expressions in Range Bounds 9.16 Action on Assertion Violations; 9.17 'Path_Name and 'Instance_Name; 9.18 Non-Nesting of Architecture Region; 9.19 Purity of Now; 9.20 Delimited Comments; 9.21 Tool Directives; 9.22 New Reserved Words; 9.23 Replacement Characters; Chapter 10. What's Next; 10.1 Object-Oriented Class Types; 10.2 Randomization; 10.3 Functional Coverage; 10.4 Alternatives; 10.5 Getting Involved; IndexVHDL-2008: Just the New Stuff, as its title says, introduces the new features added to the latest revision of the IEEE standard for the VHDL hardware description language. Written by the Chair and Technical Editor of the IEEE working group, the book is an authoritative guide to how the new features work and how to use them to improve design productivity. It will be invaluable for early adopters of the new language version, for tool implementers, and for those just curious about where VHDL is headed.* First in the market describing the new features of VHDL 2008;* Just the new featurMorgan Kaufmann series in systems on silicon.VHDL (Computer hardware description language)Electronic books.VHDL (Computer hardware description language)621.39/2Ashenden Peter J62474Lewis Jim1962-953099MiAaPQMiAaPQMiAaPQBOOK9910450682303321VHDL-20082154739UNINA04226nam 22008055 450 991029860110332120200702133029.03-319-99897-810.1007/978-3-319-99897-8(CKB)4100000006999216(MiAaPQ)EBC5540881(DE-He213)978-3-319-99897-8(PPN)231461488(EXLCZ)99410000000699921620181004d2018 u| 0engurcnu||||||||txtrdacontentcrdamediacrrdacarrier Advanced Analytical Methods in Tribology /edited by Martin Dienwiebel, Maria-Isabel De Barros Bouchet1st ed. 2018.Cham :Springer International Publishing :Imprint: Springer,2018.1 online resource (332 pages)Microtechnology and MEMS,1615-83263-319-99896-X Introduction -- Microstructural Characterization -- Chemical Characterization -- Mechanical Characterization -- Topography Analysis -- Numerical Calculations.Friction and wear phenomena are governed by processes at the interface of sliding surfaces. For a detailed understanding of these phenomena many surface sensitive techniques have become available in recent years. This book gives an overview of the basics and methods of state-of-the-art nanoscale analytical techniques for researchers and practitioners in the field of tribology. It provides guidance and shows examples of the application of mechanical, microstructural, chemical characterization methods and topography analysis of materials. The applied methods are atom probe tomography, TEM, SERS, NEXAFS, in-situ XPS, nanoindentation and in situ Raman spectroscopy. A survey of related numerical calculations completes the book. These include ab-initio and molecular dynamics coupling, numerical calculations for mechanical aspects and density functional theory to study chemical reactivity.Microtechnology and MEMS,1615-8326TribologyCorrosion and anti-corrosivesCoatingsSurfaces (Physics)Interfaces (Physical sciences)Thin filmsMaterials scienceNanotechnologyPhysical measurementsMeasurement   MechanicsTribology, Corrosion and Coatingshttps://scigraph.springernature.com/ontologies/product-market-codes/Z15000Surface and Interface Science, Thin Filmshttps://scigraph.springernature.com/ontologies/product-market-codes/P25160Characterization and Evaluation of Materialshttps://scigraph.springernature.com/ontologies/product-market-codes/Z17000Nanotechnology and Microengineeringhttps://scigraph.springernature.com/ontologies/product-market-codes/T18000Measurement Science and Instrumentationhttps://scigraph.springernature.com/ontologies/product-market-codes/P31040Classical Mechanicshttps://scigraph.springernature.com/ontologies/product-market-codes/P21018Tribology.Corrosion and anti-corrosives.Coatings.Surfaces (Physics).Interfaces (Physical sciences).Thin films.Materials science.Nanotechnology.Physical measurements.Measurement   .Mechanics.Tribology, Corrosion and Coatings.Surface and Interface Science, Thin Films.Characterization and Evaluation of Materials.Nanotechnology and Microengineering.Measurement Science and Instrumentation.Classical Mechanics.621.89Dienwiebel Martinedthttp://id.loc.gov/vocabulary/relators/edtDe Barros Bouchet Maria-Isabeledthttp://id.loc.gov/vocabulary/relators/edtBOOK9910298601103321Advanced Analytical Methods in Tribology1568345UNINA