06140nam 2200733 450 991045010460332120180406212929.01-280-44178-X0-19-802281-697866104417850-19-534469-31-60256-628-3(CKB)1000000000033356(StDuBDS)AH24082831(SSID)ssj0000365581(PQKBManifestationID)12136863(PQKBTitleCode)TC0000365581(PQKBWorkID)10413671(PQKB)10043994(SSID)ssj0000241578(PQKBManifestationID)12031826(PQKBTitleCode)TC0000241578(PQKBWorkID)10298017(PQKB)11563063(OCoLC)228117554(MiAaPQ)EBC241662(MiAaPQ)EBC5567791(Au-PeEL)EBL5567791(OCoLC)1061127334(EXLCZ)99100000000003335620181122d1994 uy 0engurcn|||||||||txtccrScanning force microscopy with applications to electric, magnetic, and atomic forces /Dror SaridRev. ed.New York, New York ;Oxford, England :Oxford University Press,1994.1 online resource (xiii,263p. )illOxford series in optical and imaging sciencesPrevious ed.: 1991.0-19-506270-1 0-19-509204-X Includes bibliographical references (p. 233-259) and index.Intro -- Contents -- PREFACE TO THE REVISED EDITION -- PREFACE -- PART ONE. LEVERS AND NOISE -- Chapter 1 Mechanical Properties of Levers -- 1.1. Introduction -- 1.2. Stress and Strain -- 1.3. Moments -- 1.4. Spring Constant -- 1.5. The Rayleigh Solution to a Vibrating Lever -- 1.6. The Classical Solution to a Vibrating Lever -- 1.7. Normal Modes -- 1.8. Lumped Systems -- 1.9. Examples -- 1.10. Summary -- Chapter 2 Resonance Enhancement -- 2.1. Introduction -- 2.2. Bimorph Driver -- 2.3. Effective Spring Constant -- 2.4. Bimorph-Driven Lever -- 2.5. Sample-Driven Lever -- 2.6. Tip-Driven Lever -- 2.7. Summary -- Chapter 3 Sources of Noise -- 3.1. Introduction -- 3.2. General Discussion of Noise -- 3.3. Shot Noise -- 3.4. Resistor Johnson Noise -- 3.5. Laser Intensity Noise -- 3.6. Laser Phase Noise -- 3.7. Thermally Induced Lever Noise -- 3.8. Bimorph Noise -- 3.9. Lever Noise-Limited SNR -- 3.10. Experimental Characterization of Noise -- 3.11. Summary -- PART TWO. SCANNING FORCE MICROSCOPES -- Chapter 4 Tunneling Detection System -- 4.1. Introduction -- 4.2. Theory -- 4.3. Perpendicular Arrangement -- 4.4. Cross Arrangement -- 4.5. Parallel Arrangement -- 4.6. Serial Arrangement -- 4.7. Single-Lever Arrangement -- 4.8. Summary -- Chapter 5 Capacitance Detection System -- 5.1. Introduction -- 5.2. Theory -- 5.3. Noise Considerations -- 5.4. Performance of Systems -- 5.5. Summary -- Chapter 6 Homodyne Detection System -- 6.1. Introduction -- 6.2. Theory -- 6.3. Noise Considerations -- 6.4. System Performance -- 6.5. Summary -- Chapter 7 Heterodyne Detection System -- 7.1. Introduction -- 7.2. Theory -- 7.3. Noise Considerations -- 7.4. Performance -- 7.5. Summary -- Chapter 8 Laser-Diode Feedback Detection System -- 8.1. Introduction -- 8.2. Theory -- 8.3. Noise Considerations -- 8.4. Performance -- 8.5. Summary.Chapter 9 Polarization Detection System -- 9.1. Introduction -- 9.2. Theory -- 9.3. Noise Considerations -- 9.4. Performance -- 9.5. Summary -- Chapter 10 Deflection Detection System -- 10.1. Introduction -- 10.2. Theory -- 10.3. Noise Considerations -- 10.4. Performance -- 10.5. Summary -- PART THREE. SCANNING FORCE MICROSCOPY -- Chapter 11 Electric Force Microscopy -- 11.1. Introduction -- 11.2. Basic Concepts -- 11.3. Examples -- 11.4. Principles of Operation -- 11.5. Noise Considerations -- 11.6. Applications -- 11.7. Performance -- 11.8. Summary -- Chapter 12 Magnetic Force Microscopy -- 12.1. Introduction -- 12.2. Basic Concepts -- 12.3. Examples -- 12.4. Principles of Operation -- 12.5. Noise Considerations -- 12.6. Applications -- 12.7. Performance -- 12.8. Summary -- Chapter 13 Atomic Force Microscopy -- 13.1. Introduction -- 13.2. Intermolecular Microscopic Interactions -- 13.3. Intermolecular Macroscopic Interactions -- 13.4. Lever-Tip-Sample Contact Interactions -- 13.5. Lever-Tip-Sample Noncontact Interactions -- 13.6. Experimental Results for the Contact Mode -- References -- Index.Includes information about the mapping of a variety of forces across surfaces, including basic theory, instrumentation, and applications. This book also includes research in SFM and a bibliography. It will be useful for academic and industrial researchers using SFM.This technology has proved indispensable as a characterization tool with applications in surface physics, chemistry, materials science, bio-science, and data storage media. It has also shown great potential in areas such as the semiconductor and optical quality control industries. This revised edition updates the earlier such survey of the many rapidly developing subjects concerning the mapping of a variety of forces across surfaces, including basic theory, instrumentation, and applications. It also includes important new research in SFM and a thoroughly revised bibliography. Academic and industrial researchers using SFM or wishing to know more about its potential, will find this book an excellent introduction to this rapidly developing field.Oxford series in optical and imaging sciences.Scanning force microscopySurfaces (Physics)Electronic books.Scanning force microscopy.Surfaces (Physics)502.82Sarid Dror745994MiAaPQMiAaPQMiAaPQBOOK9910450104603321Scanning force microscopy1488437UNINA