01181nam 2200337 450 991043735120332120230422073125.01-7281-5359-X(CKB)5410000000003416(NjHacI)995410000000003416(EXLCZ)99541000000000341620230422d2020 uy 0engur|||||||||||txtrdacontentcrdamediacrrdacarrier2020 IEEE 38th VLSI Test Symposium (VTS) /Institute of Electrical and Electronics Engineers (IEEE)Piscataway, New Jersey :Institute of Electrical and Electronics Engineers (IEEE),2020.1 online resource (various pagings) illustrations1-7281-5360-3 2020 IEEE 38th VLSI Test Symposium Integrated circuitsVery large scale integrationTestingCongressesIntegrated circuitsVery large scale integrationTesting621NjHacINjHaclPROCEEDING99104373512033212020 IEEE 38th VLSI Test Symposium (VTS)2514266UNINA