01745nam 2200337 450 991043734040332120230415023703.01-7281-4892-8(CKB)5410000000003477(NjHacI)995410000000003477(EXLCZ)99541000000000347720230415d2020 uy 0engur|||||||||||txtrdacontentcrdamediacrrdacarrier2020 IEEE International Workshop on Metrology for Industry 4.0 & IoT /Institute of Electrical and Electronics Engineers[Place of publication not identified] :Institute of Electrical and Electronics Engineers,2020.1 online resource1-7281-4893-6 MetroInd4 0&IoT aims to discuss the contributions both of the metrology for the development of Industry 4 0 and IoT and the new opportunities offered by Industry 4 0 and IoT for the development of new measurement methods and apparatus MetroInd4 0&IoT aims to gather people who work in developing instrumentation and measurement methods for Industry 4 0 and IoT Attention is paid, but not limited to, new technology for metrology assisted production in Industry 4 0 and IoT, Industry 4 0 and IoT component measurement, sensors and associated signal conditioning for Industry 4 0 and IoT, and calibration methods for electronic test and measurement for Industry 4 0 and IoT.MetrologyCongressesMetrology389.1NjHacINjHaclPROCEEDING99104373404033212020 IEEE International Workshop on Metrology for Industry 4.0 & IoT2500849UNINA