03013nam 2200577Ia 450 991040376140332120210813230250.01-4665-0347-5(CKB)2670000000316832(EBL)1107603(OCoLC)823719605(SSID)ssj0000803732(PQKBManifestationID)11488888(PQKBTitleCode)TC0000803732(PQKBWorkID)10811509(PQKB)11684281(MiAaPQ)EBC1107603(CaSebORM)9781466503472(EXLCZ)99267000000031683220120920d2013 uy 0engur|n|---|||||txtccrStrain-engineered MOSFETs /C. K. Maiti, T. K. Maiti1st editionBoca Raton Taylor & Francisc20131 online resource (311 p.)Description based upon print version of record.1-4665-0055-7 Includes bibliographical references and index.Front Cover; Contents; Preface; About the Authors; List of Abbreviations; List of Symbols; Chapter 1 - Introduction; Chapter 2 - Substrate-Induced Strain Engineering in CMOS Technology; Chapter 3 - Process-Induced Stress Engineering in CMOS Technology; Chapter 4 - Electronic Properties of Strain-Engineered Semiconductors; Chapter 5 - Strain-Engineered MOSFETs; Chapter 6 - Noise in Strain-Engineered Devices; Chapter 7 - Technology CAD of Strain-Engineered MOSFETs; Chapter 8 - Reliability and Degradation of Strain-Engineered MOSFETsChapter 9 - Process Compact Modelling of Strain-Engineered MOSFETsChapter 10 - Process-Aware Design of Strain-Engineered MOSFETs; Chapter 11 - Conclusions; Back CoverCurrently strain engineering is the main technique used to enhance the performance of advanced silicon-based metal-oxide-semiconductor field-effect transistors (MOSFETs). Written from an engineering application standpoint, Strain-Engineered MOSFETs introduces promising strain techniques to fabricate strain-engineered MOSFETs and to methods to assess the applications of these techniques. The book provides the background and physical insight needed to understand new and future developments in the modeling and design of n- and p-MOSFETs at nanoscale. This book foIntegrated circuitsFault toleranceMetal oxide semiconductor field-effect transistorsReliabilityStrains and stressesElectronic books.Integrated circuitsFault tolerance.Metal oxide semiconductor field-effect transistorsReliability.Strains and stresses.621.3815/284621.3815284Maiti C. K866187Maiti T. K866188MiAaPQBOOK9910403761403321Strain-engineered MOSFETs1933236UNINA