01935nam 2200433 450 991037586010332120230809231615.0(CKB)4100000004910045(WaSeSS)IndRDA00103650(EXLCZ)99410000000491004520180823d2017 uy 0engur|||||||||||txtrdacontentcrdamediacrrdacarrierISSTA '17 proceedings of the 26th ACM SIGSOFT International Symposium on Software Testing and Analysis : July 10-14, 2017, Santa Barbara, CA, USA /edited by Tevfik Bultan and Koushik Sen ; sponsored by ACM SIGSOFTNew York :ACM,2017.1 online resource (447 pages)Includes index.1-4503-5076-3 International Symposium on Software Testing and Analysis '17 :proceedings of the 26th Association for Computing Machinery Special Interest Group on Software Engineering International Symposium on Software Testing and Analysis : July 10-14, 2017, Santa Barbara, California, United States of AmericaInternational Symposium on Software Testing and Analysis 2017Proceedings of the 26th ACM SIGSOFT International Symposium on Software Testing and AnalysisProceedings of the 26th Association for Computing Machinery Special Interest Group on Software Engineering International Symposium on Software Testing and AnalysisComputer softwareTestingCongressesComputer softwareEvaluationCongressesComputer softwareTestingComputer softwareEvaluation005.14Bultan TevfikSen KoushikACM Sigsoft,WaSeSSWaSeSSBOOK9910375860103321ISSTA '171957719UNINA