01522nam 2200337z- 450 9910346932903321202102111000008735(CKB)4920000000101193(oapen)https://directory.doabooks.org/handle/20.500.12854/47322(oapen)doab47322(EXLCZ)99492000000010119320202102d2008 u| 0engurmn|---annantxtrdacontentcrdamediacrrdacarrierFactorization methods for photonics and rough surfacesKIT Scientific Publishing20081 online resource (VI, 156 p. p.)3-86644-256-4 This thesis investigates non-destructive testing problems for rough and periodic surfaces, where the task is to determine such structures from scattered waves. Such problems are non-linear and ill-posed. We are interested in the analysis of the Factorization method applied to this class of inverse scattering problems. This method does not attempt to solve a non-linear operator equation for the unknown object but computes a binary criterion characterizing points inside and outside the structure.Factorization methodinverse scattering problemsurface scatteringLechleiter Arminauth1304413BOOK9910346932903321Factorization methods for photonics and rough surfaces3027379UNINA