01824nam 22005053a 450 991034667290332120250203235435.09783038975281303897528110.3390/books978-3-03897-528-1(CKB)4920000000094938(oapen)https://directory.doabooks.org/handle/20.500.12854/58480(ScCtBLL)32bc0069-6d6b-431e-bf49-a00f1769b98e(OCoLC)1163837055(oapen)doab58480(EXLCZ)99492000000009493820250203i20192019 uu engurmn|---annantxtrdacontentcrdamediacrrdacarrierRietveld Refinement in the Characterization of Crystalline MaterialsIgor DjerdjMDPI - Multidisciplinary Digital Publishing Institute2019Basel, Switzerland :MDPI,2019.1 electronic resource (88 p.)9783038975274 3038975273 This Special Issue serves as a crystallographic forum covering various aspects of material science that have in common the use of the powerful Rietveld method in the analysis of the powder XRD patterns of investigated compounds.ChemistrybicsscRietveld methodStructural characterizationMicrostructural analysisCrystalline materialsStructural materialsX-ray and neutron diffractionFunctional materialsChemistryDjerdj Igor1786235ScCtBLLScCtBLLBOOK9910346672903321Rietveld Refinement in the Characterization of Crystalline Materials4317651UNINA