01440nam 2200373z- 450 991034667290332120231214133557.03-03897-528-1(CKB)4920000000094938(oapen)https://directory.doabooks.org/handle/20.500.12854/58480(EXLCZ)99492000000009493820202102d2019 |y 0engurmn|---annantxtrdacontentcrdamediacrrdacarrierRietveld Refinement in the Characterization of Crystalline MaterialsMDPI - Multidisciplinary Digital Publishing Institute20191 electronic resource (88 p.)3-03897-527-3 This Special Issue serves as a crystallographic forum covering various aspects of material science that have in common the use of the powerful Rietveld method in the analysis of the powder XRD patterns of investigated compounds.Rietveld methodStructural characterizationMicrostructural analysisCrystalline materialsStructural materialsX-ray and neutron diffractionFunctional materialsIgor Djerdj (Ed.)auth1305934BOOK9910346672903321Rietveld Refinement in the Characterization of Crystalline Materials3028036UNINA