04049nam 22006615 450 991033793030332120200703160256.03-030-13654-X10.1007/978-3-030-13654-3(CKB)4100000008280440(MiAaPQ)EBC5780030(DE-He213)978-3-030-13654-3(PPN)236522485(EXLCZ)99410000000828044020190523d2019 u| 0engurcnu||||||||txtrdacontentcrdamediacrrdacarrierAtomic Force Microscopy /by Bert Voigtländer2nd ed. 2019.Cham :Springer International Publishing :Imprint: Springer,2019.1 online resource (329 pages)NanoScience and Technology,1434-49043-030-13653-1 Introduction -- Part I: Scanning Probe Microscopy Instrumentation -- Harmonic Oscillator -- Technical Aspects of Scanning Probe Microscopy -- Scanning Probe Microscopy Designs -- Electronics for Scanning Probe Microscopy -- Lock-In Technique -- Data Representation and Image Processing -- Artifacts in SPM -- Work Function, Contact Potential, and Kelvin Probe -- Part II: Atomic Force Microscopy (AFM) -- Forces between Tip and Sample -- Technical Aspects of Atomic Force Microscopy -- Static Atomic Force Microscopy -- Amplitude Modulation (AM) Mode in Dynamic Atomic Force Microscopy -- Intermittent Contact Mode/Tapping Mode -- Mapping of Mechanical Properties Using Force-Distance -- Frequency Modulation (FM) Mode in Dynamic Atomic Force -- Noise in Atomic Force Microscopy -- Quartz Sensors in Atomic Force Microscopy.This book explains the operating principles of atomic force microscopy with the aim of enabling the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. This enhanced second edition to "Scanning Probe Microscopy" (Springer, 2015) represents a substantial extension and revision to the part on atomic force microscopy of the previous book. Covering both fundamental and important technical aspects of atomic force microscopy, this book concentrates on the principles the methods using a didactic approach in an easily digestible manner. While primarily aimed at graduate students in physics, materials science, chemistry, nanoscience and engineering, this book is also useful for professionals and newcomers in the field, and is an ideal reference book in any atomic force microscopy lab.NanoScience and Technology,1434-4904SpectroscopyMicroscopyNanotechnologyNanoscale scienceNanoscienceNanostructuresSpectroscopy and Microscopyhttps://scigraph.springernature.com/ontologies/product-market-codes/P31090Nanotechnologyhttps://scigraph.springernature.com/ontologies/product-market-codes/Z14000Nanotechnology and Microengineeringhttps://scigraph.springernature.com/ontologies/product-market-codes/T18000Nanoscale Science and Technologyhttps://scigraph.springernature.com/ontologies/product-market-codes/P25140Biological Microscopyhttps://scigraph.springernature.com/ontologies/product-market-codes/L26000Spectroscopy.Microscopy.Nanotechnology.Nanoscale science.Nanoscience.Nanostructures.Spectroscopy and Microscopy.Nanotechnology.Nanotechnology and Microengineering.Nanoscale Science and Technology.Biological Microscopy.502.82620.5Voigtländer Bertauthttp://id.loc.gov/vocabulary/relators/aut770205BOOK9910337930303321Atomic Force Microscopy1570972UNINA