03887nam 22007935 450 991033792990332120200702181940.03-030-06143-410.1007/978-3-030-06143-2(CKB)4100000007598199(DE-He213)978-3-030-06143-2(MiAaPQ)EBC5691967(PPN)235005932(EXLCZ)99410000000759819920190208d2019 u| 0engurnn|008mamaatxtrdacontentcrdamediacrrdacarrierAdvanced Real Time Imaging II Cutting-Edge Techniques in Materials Science Studies /edited by Jinichiro Nakano, P Chris Pistorius, Candan Tamerler, Hideyuki Yasuda, Zuotai Zhang, Neslihan Dogan, Wanlin Wang, Noritaka Saito, Bryan Webler1st ed. 2019.Cham :Springer International Publishing :Imprint: Springer,2019.1 online resource (XII, 154 p. 86 illus., 54 illus. in color.) The Minerals, Metals & Materials Series,2367-11813-030-06142-6 Real Time Imaging -- Cutting Edge Techniques -- Non-Ambient Conditions.“Real time” imaging techniques have assisted materials science studies especially for non-ambient environments. These techniques have never been collectively featured in a single venue. The book is an assembly of materials studies utilizing cutting edge real time imaging techniques, emphasizing the significance and impact of those techniques.The Minerals, Metals & Materials Series,2367-1181Materials scienceEngineering—MaterialsOptical materialsElectronic materialsLasersPhotonicsSpectroscopyMicroscopyCharacterization and Evaluation of Materialshttps://scigraph.springernature.com/ontologies/product-market-codes/Z17000Materials Engineeringhttps://scigraph.springernature.com/ontologies/product-market-codes/T28000Optical and Electronic Materialshttps://scigraph.springernature.com/ontologies/product-market-codes/Z12000Optics, Lasers, Photonics, Optical Deviceshttps://scigraph.springernature.com/ontologies/product-market-codes/P31030Spectroscopy and Microscopyhttps://scigraph.springernature.com/ontologies/product-market-codes/P31090Materials science.Engineering—Materials.Optical materials.Electronic materials.Lasers.Photonics.Spectroscopy.Microscopy.Characterization and Evaluation of Materials.Materials Engineering.Optical and Electronic Materials.Optics, Lasers, Photonics, Optical Devices.Spectroscopy and Microscopy.620.11Nakano Jinichiroedthttp://id.loc.gov/vocabulary/relators/edtPistorius P Chrisedthttp://id.loc.gov/vocabulary/relators/edtTamerler Candanedthttp://id.loc.gov/vocabulary/relators/edtYasuda Hideyukiedthttp://id.loc.gov/vocabulary/relators/edtZhang Zuotaiedthttp://id.loc.gov/vocabulary/relators/edtDogan Neslihanedthttp://id.loc.gov/vocabulary/relators/edtWang Wanlinedthttp://id.loc.gov/vocabulary/relators/edtSaito Noritakaedthttp://id.loc.gov/vocabulary/relators/edtWebler Bryanedthttp://id.loc.gov/vocabulary/relators/edtBOOK9910337929903321Advanced Real Time Imaging II1570061UNINA