05372nam 22006853u 450 991014624270332120220408225037.01-280-55760-597866105576083-527-60016-7(CKB)1000000000019319(EBL)822727(OCoLC)768732534(SSID)ssj0000310784(PQKBManifestationID)11264590(PQKBTitleCode)TC0000310784(PQKBWorkID)10312957(PQKB)10986897(MiAaPQ)EBC5247739(Au-PeEL)EBL5247739(CaONFJC)MIL55760(OCoLC)1027167757(EXLCZ)99100000000001931920131028d2011|||| u|| |engur|n|---|||||txtccrSurface and Thin Film Analysis A Compendium of Principles, Instrumentation and Applications2nd ed.Hoboken Wiley20111 online resource (559 p.)Description based upon print version of record.3-527-30458-4 Surface and Thin Film Analysis: A Compendium of Principles, Instrumentation, and Applications; Contents; Preface to the First Edition; Preface to the Second Edition; List of Contributors; 1: Introduction; Part One: Electron Detection; 2: X-Ray Photoelectron Spectroscopy (XPS); 2.1 Principles; 2.2 Instrumentation; 2.2.1 Vacuum Requirements; 2.2.2 X-Ray Sources; 2.2.3 Synchrotron Radiation; 2.2.4 Electron Energy Analyzers; 2.2.5 Spatial Resolution; 2.3 Spectral Information and Chemical Shifts; 2.4 Quantification, Depth Profiling, and Imaging; 2.4.1 Quantification; 2.4.2 Depth Profiling2.4.3 Imaging2.5 The A uger Parameter; 2.6 Applications; 2.6.1 Catalysis; 2.6.2 Polymers; 2.6.3 Corrosion and Passivation; 2.6.4 Adhesion; 2.6.5 Superconductors; 2.6.6 Semiconductors; 2.7 Ultraviolet Photoelectron Spectroscopy (UPS); References; 3: Auger Electron Spectroscopy (AES); 3.1 Principles; 3.2 Instrumentation; 3.2.1 Vacuum Requirements; 3.2.2 Electron Sources; 3.2.3 Electron-Energy Analyzers; 3.3 Spectral Information; 3.4 Quantification and Depth Profiling; 3.4.1 Quantification; 3.4.2 Depth Profiling; 3.5 Applications; 3.5.1 Grain Boundary Segregation; 3.5.2 Semiconductor Technology3.5.3 Thin Films and Interfaces3.5.4 Surface Segregation; 3.6 Scanning A uger Microscopy (SAM); References; 4: Electron Energy-Loss Spectroscopy (EELS) and Energy-Filtering Transmission Electron Microscopy (EFTEM); 4.1 Principles; 4.2 Instrumentation; 4.3 Qualitative Spectral Information; 4.3.1 Low-Loss Excitations; 4.3.2 Ionization Losses; 4.3.3 Fine Structures; 4.4 Quantification; 4.5 Imaging of Element Distribution; 4.6 Summary; References; 5: Low-Energy Electron Diffraction (LEED); 5.1 Principles and History; 5.2 Instrumentation; 5.3 Qualitative Information; 5.3.1 LEED Pattern5.3.2 Spot Profile Analysis5.3.3 Applications and Restrictions; 5.4 Quantitative Structural Information; 5.4.1 Principles; 5.4.2 Experimental Techniques; 5.4.3 Computer Programs; 5.4.4 Applications and Restrictions; 5.5 Low-Energy Electron Microscopy; 5.5.1 Principles of Operation; 5.5.2 Applications and Restrictions; References; 6: Other Electron-Detecting Techniques; 6.1 Ion (Excited) Auger Electron Spectroscopy (IAES); 6.2 Ion Neutralization Spectroscopy (INS); 6.3 Inelastic Electron Tunneling Spectroscopy (IETS); Reference; Part Two: Ion Detection7: Static Secondary Ion Mass Spectrometry (SSIMS)7.1 Principles; 7.2 Instrumentation; 7.2.1 Ion Sources; 7.2.2 Mass Analyzers; 7.2.2.1 Quadrupole Mass Spectrometers; 7.2.2.2 Time-of-Flight Mass Spectrometry (TOF-MS); 7.3 Quantification; 7.4 Spectral Information; 7.5 Applications; 7.5.1 Oxide Films; 7.5.2 Interfaces; 7.5.3 Polymers; 7.5.4 Biosensors; 7.5.5 Surface Reactions; 7.5.6 Imaging; 7.5.7 Ultra-Shallow Depth Profiling; References; 8: Dynamic Secondary Ion Mass Spectrometry (SIMS); 8.1 Principles; 8.1.1 Compensation of Preferential Sputtering; 8.1.2 Atomic Mixing8.1.3 Implantation of Primary IonsSurveying and comparing all techniques relevant for practical applications, this second edition of a bestseller is a vital guide to this hot topic in nano- and surface technology. Completely revised and updated, sections include electron, ion and photon detection, as well as scanning microscopy, while new chapters have been added to cover such recently developed techniques as SNOM, SERS, and laser ablation. Over 500 references and a list of equipment suppliers make this a rapid reference for materials scientists, analytical chemists, and those working in the biotechnological industry.Thin filmsAnalysisSurfacesElectron spectroscopySpectrum analysisElectronic books.Thin filmsAnalysisSurfacesElectron spectroscopySpectrum analysis530.4275541.33Bubert Henning903323Jenett Holger921755AU-PeELAU-PeELAU-PeELBOOK9910146242703321Surface and Thin Film Analysis2068027UNINA02808nam0-2200445---450 991031355950332120231221110412.0R.D. m-re r.s, sote (3) 1724 (R)feiIT-NA0338: A VII 446 (1R.D. m-re r.s, sote (3) 1724 (R)feiIT-NA0338: D V 1720190402d1724----km-y0itay50------balatGBa-----------------bb0-------Johannis Raii Synopsis methodica stirpium Britannicarum: tum indigenis, tum in agris cultis locis suis dispositis; additis generum characteristicis, specierum descriptionibus & virium epitome. Duobus tomis Tom. I. [-II,]Editio tertia multis locis emendata, & quadringentis quinquaginta circiter speciebus noviter detectis aucta. Cum iconibusLondiniimpensis Gulielmi & Joannis Innys, in area occidentali D. Pauli, & S. Tooke & B. Motte, ad Medii Templi Portam, Fleetstreet17242 v.ill. calcogr.8°Paginazione e segnatura continue nei 2 v.Segn.: A-T⁸ *T⁴ (v. 1)Segn.: π¹ U-2K⁸ (v. 2)1.: [17], 2-288, *281-*288 p., [1], XI c. di tav., di cui 1 rip. ; 2.: [2] p., P. 289-482, [30] p., c. di tav. XII-XXIV, di cui 1 rip.Piatto anteriore completamente staccatoIT-NA0338: A VII 446 (1Mutilo delle c. di tav. III, X, XXIVIT-NA0338: D V 17Timbro ovale: "R. Orto Botanico di Napoli Biblioteca Tenoreana" sul front.IT-NA0338: A VII 446 (1Timbro ovale: "R. Orto Botanico di Napoli Biblioteca Tenoreana" a c. A2IT-NA0338: D V 17Pritzel18727438https://books.google.it/books?id=_FnAgYaaY0AC&printsec=frontcover&hl=it&source=gbs_ge_summary_r&cad=0#v=snippet&q=7438&f=falseSynopsis methodica stirpium Britannicarum: tum indigenis, tum in agris cultis locis suis dispositis; additis generum characteristicis, specierum descriptionibus & virium epitome. Duobus tomis Tom. I. [-II,]Gran Bretagna.LondraRay,John<1627-1705>762103Innys,William& Innys John650ITUNINAREICATUNIMARCVisualizza la versione elettronica in Bayerische StaatsBibliothek digitalhttps://reader.digitale-sammlungen.de/de/fs1/object/display/bsb10302839_00007.html201900403AQ9910313559503321A VII 446 (1385DBVA VII 446 (2DBVD V 171857DBVDBVJohannis Raii Synopsis methodica stirpium Britannicarum: tum indigenis, tum in agris cultis locis suis dispositis; additis generum characteristicis, specierum descriptionibus & virium epitome. Duobus tomis Tom. I.1567884UNINA