02241nam0 2200553 i 450 VAN012402820230703024555.53N978331963231520191007d2017 |0itac50 baengCH|||| |||||Harmonic and Complex Analysis in Several VariablesSteven G. KrantzChamSpringer2017xii, 424 p.24 cm001VAN00304862001 Springer monographs in mathematics210 Berlin [etc.]SpringerVAN0235648Harmonic and Complex Analysis in Several Variables156246632A50Harmonic analysis of several complex variables [MSC 2020]VANC020470MFAdmissible convergenceKW:KBergman KernelsKW:KBergman metricKW:KCalderon-Zygmund theoryKW:KCanonical kernelsKW:KCauchy-Riemann equationsKW:KConstructive kernelsKW:KFinsler geometryKW:KFolland-Stein theoremKW:KHarmonic analysisKW:KHeisenberg groupKW:KHolomorphic functionKW:KMonge-Ampère equationKW:KPaley-Wiener theoremKW:KPoisson KernelKW:KProlegomenaKW:KReproducing kernelsKW:KSeveral complex variablesKW:KSzego integralKW:Kd-bar Neumann problemKW:KCHChamVANL001889KrantzSteven G.VANV03567855961Springer <editore>VANV108073650ITSOL20240614RICAhttp://doi.org/10.1007/978-3-319-63231-5E-book – Accesso al full-text attraverso riconoscimento IP di Ateneo, proxy e/o ShibbolethBIBLIOTECA DEL DIPARTIMENTO DI MATEMATICA E FISICAIT-CE0120VAN08NVAN0124028BIBLIOTECA DEL DIPARTIMENTO DI MATEMATICA E FISICA08CONS e-book 0708 08eMF708 20191007 Harmonic and Complex Analysis in Several Variables1562466UNICAMPANIA04401nam 22008655 450 991030041070332120200701162733.04-431-55028-310.1007/978-4-431-55028-0(CKB)3710000000244788(EBL)1968611(OCoLC)908090065(SSID)ssj0001354154(PQKBManifestationID)11896012(PQKBTitleCode)TC0001354154(PQKBWorkID)11322535(PQKB)10917624(DE-He213)978-4-431-55028-0(MiAaPQ)EBC1968611(PPN)181354497(EXLCZ)99371000000024478820140920d2015 u| 0engur|n|---|||||txtccrHigh-Resolution Spin-Resolved Photoemission Spectrometer and the Rashba Effect in Bismuth Thin Films /by Akari Takayama1st ed. 2015.Tokyo :Springer Japan :Imprint: Springer,2015.1 online resource (92 p.)Springer Theses, Recognizing Outstanding Ph.D. Research,2190-5053Description based upon print version of record.4-431-55027-5 Includes bibliographical references.Introduction -- Basic Principle of Photoemission Spectroscopy and Spin Detector -- Development of High Resolution Spin-Resolved Photoemission Spectrometer -- Anomalous Rashba Effect of a Bi Thin Film on Si(111) -- Rashba Effect at Interface of a Bi Thin Film on Si(111) -- Conclusion.In this thesis, the author has developed a high-resolution spin-resolved photoemission spectrometer that achieves the world-best energy resolution of 8 meV. The author has designed a new, highly efficient mini Mott detector that has a large electron acceptance angle and an atomically flat gold target to enhance the efficiency of detecting scattered electrons.   The author measured the electron and spin structure of Bi thin film grown on a Si(111) surface to study the Rashba effect. Unlike the conventional Rashba splitting, an asymmetric in-plane spin polarization and a tremendous out-of-plane spin component were observed. Moreover, the author found that the spin polarization of Rashba surface states is reduced by decreasing the film thickness, which indicates the considerable interaction of Rashba spin-split states between the surface and Bi/Si interface.Springer Theses, Recognizing Outstanding Ph.D. Research,2190-5053Surfaces (Physics)Interfaces (Physical sciences)Thin filmsSpectrum analysisMicroscopyMaterials—SurfacesPhysical measurementsMeasurementSemiconductorsSurface and Interface Science, Thin Filmshttps://scigraph.springernature.com/ontologies/product-market-codes/P25160Spectroscopy and Microscopyhttps://scigraph.springernature.com/ontologies/product-market-codes/P31090Surfaces and Interfaces, Thin Filmshttps://scigraph.springernature.com/ontologies/product-market-codes/Z19000Measurement Science and Instrumentationhttps://scigraph.springernature.com/ontologies/product-market-codes/P31040Semiconductorshttps://scigraph.springernature.com/ontologies/product-market-codes/P25150Surfaces (Physics)Interfaces (Physical sciences)Thin films.Spectrum analysis.Microscopy.Materials—Surfaces.Physical measurements.Measurement.Semiconductors.Surface and Interface Science, Thin Films.Spectroscopy and Microscopy.Surfaces and Interfaces, Thin Films.Measurement Science and Instrumentation.Semiconductors.530530.417530.8537.622Takayama Akariauthttp://id.loc.gov/vocabulary/relators/aut792815BOOK9910300410703321High-Resolution Spin-Resolved Photoemission Spectrometer and the Rashba Effect in Bismuth Thin Films1773052UNINA