04405nam 22008655 450 991030041070332120200701162733.04-431-55028-310.1007/978-4-431-55028-0(CKB)3710000000244788(EBL)1968611(OCoLC)908090065(SSID)ssj0001354154(PQKBManifestationID)11896012(PQKBTitleCode)TC0001354154(PQKBWorkID)11322535(PQKB)10917624(DE-He213)978-4-431-55028-0(MiAaPQ)EBC1968611(PPN)181354497(EXLCZ)99371000000024478820140920d2015 u| 0engur|n|---|||||txtccrHigh-Resolution Spin-Resolved Photoemission Spectrometer and the Rashba Effect in Bismuth Thin Films /by Akari Takayama1st ed. 2015.Tokyo :Springer Japan :Imprint: Springer,2015.1 online resource (92 p.)Springer Theses, Recognizing Outstanding Ph.D. Research,2190-5053Description based upon print version of record.4-431-55027-5 Includes bibliographical references.Introduction -- Basic Principle of Photoemission Spectroscopy and Spin Detector -- Development of High Resolution Spin-Resolved Photoemission Spectrometer -- Anomalous Rashba Effect of a Bi Thin Film on Si(111) -- Rashba Effect at Interface of a Bi Thin Film on Si(111) -- Conclusion.In this thesis, the author has developed a high-resolution spin-resolved photoemission spectrometer that achieves the world-best energy resolution of 8 meV. The author has designed a new, highly efficient mini Mott detector that has a large electron acceptance angle and an atomically flat gold target to enhance the efficiency of detecting scattered electrons.   The author measured the electron and spin structure of Bi thin film grown on a Si(111) surface to study the Rashba effect. Unlike the conventional Rashba splitting, an asymmetric in-plane spin polarization and a tremendous out-of-plane spin component were observed. Moreover, the author found that the spin polarization of Rashba surface states is reduced by decreasing the film thickness, which indicates the considerable interaction of Rashba spin-split states between the surface and Bi/Si interface.Springer Theses, Recognizing Outstanding Ph.D. Research,2190-5053Surfaces (Physics)Interfaces (Physical sciences)Thin filmsSpectroscopyMicroscopyMaterials—SurfacesPhysical measurementsMeasurement   SemiconductorsSurface and Interface Science, Thin Filmshttps://scigraph.springernature.com/ontologies/product-market-codes/P25160Spectroscopy and Microscopyhttps://scigraph.springernature.com/ontologies/product-market-codes/P31090Surfaces and Interfaces, Thin Filmshttps://scigraph.springernature.com/ontologies/product-market-codes/Z19000Measurement Science and Instrumentationhttps://scigraph.springernature.com/ontologies/product-market-codes/P31040Semiconductorshttps://scigraph.springernature.com/ontologies/product-market-codes/P25150Surfaces (Physics).Interfaces (Physical sciences).Thin films.Spectroscopy.Microscopy.Materials—Surfaces.Physical measurements.Measurement   .Semiconductors.Surface and Interface Science, Thin Films.Spectroscopy and Microscopy.Surfaces and Interfaces, Thin Films.Measurement Science and Instrumentation.Semiconductors.530530.417530.8537.622Takayama Akariauthttp://id.loc.gov/vocabulary/relators/aut792815BOOK9910300410703321High-Resolution Spin-Resolved Photoemission Spectrometer and the Rashba Effect in Bismuth Thin Films1773052UNINA