04327nam 22008415 450 991030038960332120200704041853.03-319-04864-310.1007/978-3-319-04864-2(CKB)3710000000111952(EBL)1731006(OCoLC)902412555(SSID)ssj0001244141(PQKBManifestationID)11739282(PQKBTitleCode)TC0001244141(PQKBWorkID)11313286(PQKB)11652335(MiAaPQ)EBC1731006(DE-He213)978-3-319-04864-2(PPN)178784109(EXLCZ)99371000000011195220140508d2014 u| 0engur|n|---|||||txtccrLaboratory Micro-X-Ray Fluorescence Spectroscopy Instrumentation and Applications /by Michael Haschke1st ed. 2014.Cham :Springer International Publishing :Imprint: Springer,2014.1 online resource (367 p.)Springer Series in Surface Sciences,0931-5195 ;55Description based upon print version of record.3-319-04863-5 Includes bibliographical references and index.XRF-Basics -- Main Components of X-Ray Spectrometers -- Special Requirements for µ-XRF -- Quantification -- Sample Preparation -- Relations to Other Analytical Methods -- Applications.Micro-X-ray fluorescence offers the possibility for a position- sensitive and non-destructive analysis that can be used for the analysis of non-homogeneous materials and layer systems. This analytical technique has shown a dynamic development in the last 15 years and is used for the analysis of small particles, inclusions, of elemental distributions for a wide range of different applications both in research and quality control. The first experiments were performed on synchrotrons but there is a requirement for laboratory instruments which offers a fast and immediate access for analytical results. The book discuss the main components of a µ-XRF instrument and the different measurement modes, it gives an overview about the various instruments types, considers the special requirements for quantification of non-homogeneous materials and presents a wide range of application for single point and multi-point analysis as well as for distribution analysis in one, two and three dimensions.Springer Series in Surface Sciences,0931-5195 ;55Spectrum analysisMicroscopyMaterials—SurfacesThin filmsPhysical measurementsMeasurementSurfaces (Physics)Interfaces (Physical sciences)Spectroscopy and Microscopyhttps://scigraph.springernature.com/ontologies/product-market-codes/P31090Surfaces and Interfaces, Thin Filmshttps://scigraph.springernature.com/ontologies/product-market-codes/Z19000Measurement Science and Instrumentationhttps://scigraph.springernature.com/ontologies/product-market-codes/P31040Spectroscopy/Spectrometryhttps://scigraph.springernature.com/ontologies/product-market-codes/C11020Surface and Interface Science, Thin Filmshttps://scigraph.springernature.com/ontologies/product-market-codes/P25160Spectrum analysis.Microscopy.Materials—Surfaces.Thin films.Physical measurements.Measurement.Surfaces (Physics)Interfaces (Physical sciences)Spectroscopy and Microscopy.Surfaces and Interfaces, Thin Films.Measurement Science and Instrumentation.Spectroscopy/Spectrometry.Surface and Interface Science, Thin Films.537.5352Haschke Michaelauthttp://id.loc.gov/vocabulary/relators/aut791802MiAaPQMiAaPQMiAaPQBOOK9910300389603321Laboratory Micro-X-Ray Fluorescence Spectroscopy1770416UNINA