05508nam 2200685 450 991013230790332120230807212314.01-118-98595-81-118-98587-7(CKB)3710000000315822(EBL)1891003(SSID)ssj0001440817(PQKBManifestationID)11759727(PQKBTitleCode)TC0001440817(PQKBWorkID)11392354(PQKB)10786128(MiAaPQ)EBC1891003(Au-PeEL)EBL1891003(CaPaEBR)ebr10997811(OCoLC)896908440(EXLCZ)99371000000031582220150106h20152015 uy 0engurcnu||||||||txtccrTotal-reflection x-ray fluorescence analysis and related methods /Reinhold Klockenkämper, Alex von Bohlen2nd ed.Hoboken, New Jersey :Wiley,2015.©20151 online resource (555 p.)Chemical AnalysisDescription based upon print version of record.1-118-46027-8 Includes bibliographical references at the end of each chapters and index.Total-Reflection X-ray Fluorescence Analysis and Related Methods; Contents; Foreword; Acknowledgments; List of Acronyms; List of Physical Units and Subunits; List of Symbols; Chapter 1: Fundamentals of X-Ray Fluorescence; 1.1 A Short History of XRF; 1.2 The New Variant TXRF; 1.2.1 Retrospect on its Development; 1.2.2 Relationship of XRF and TXRF; 1.3 Nature and Production of X-Rays; 1.3.1 The Nature of X-Rays; 1.3.2 X-Ray Tubes as X-Ray Sources; 1.3.2.1 The Line Spectrum; 1.3.2.2 The Continuous Spectrum; 1.3.3 Polarization of X-Rays; 1.3.4 Synchrotron Radiation as X-Ray Source1.3.4.1 Electrons in Fields of Bending Magnets 1.3.4.2 Radiation Power of a Single Electron; 1.3.4.3 Angular and Spectral Distribution of SR; 1.3.4.4 Comparison with Black-Body Radiation; 1.4 Attenuation of X-Rays; 1.4.1 Photoelectric Absorption; 1.4.2 X-Ray Scatter; 1.4.3 Total Attenuation; 1.5 Deflection of X-Rays; 1.5.1 Reflection and Refraction; 1.5.2 Diffraction and Bragg's Law; 1.5.3 Total External Reflection; 1.5.3.1 Reflectivity; 1.5.3.2 Penetration Depth; 1.5.4 Refraction and Dispersion; References; Chapter 2: Principles of Total Reflection XRF; 2.1 Interference of X-Rays2.1.1 Double-Beam Interference 2.1.2 Multiple-Beam Interference; 2.2 X-Ray Standing Wave Fields; 2.2.1 Standing Waves in Front of a Thick Substrate; 2.2.2 Standing Wave Fields Within a Thin Layer; 2.2.3 Standing Waves Within a Multilayer or Crystal; 2.3 Intensity of Fluorescence Signals; 2.3.1 Infinitely Thick and Flat Substrates; 2.3.2 Granular Residues on a Substrate; 2.3.3 Buried Layers in a Substrate; 2.3.4 Reflecting Layers on Substrates; 2.3.5 Periodic Multilayers and Crystals; 2.4 Formalism for Intensity Calculations; 2.4.1 A Thick and Flat Substrate2.4.2 A Thin Homogeneous Layer on a Substrate 2.4.3 A Stratified Medium of Several Layers; References; Chapter 3: Instrumentation for TXRF and GI-XRF; 3.1 Basic Instrumental Setup; 3.2 High and Low-Power X-Ray Sources; 3.2.1 Fine-Focus X-Ray Tubes; 3.2.2 Rotating Anode Tubes; 3.2.3 Air-Cooled X-Ray Tubes; 3.3 Synchrotron Facilities; 3.3.1 Basic Setup with Bending Magnets; 3.3.2 Undulators, Wigglers, and FELs; 3.3.3 Facilities Worldwide; 3.4 The Beam Adapting Unit; 3.4.1 Low-Pass Filters; 3.4.2 Simple Monochromators; 3.4.3 Double-Crystal Monochromators; 3.5 Sample Positioning3.5.1 Sample Carriers 3.5.2 Fixed Angle Adjustment for TXRF ("Angle Cut"); 3.5.3 Stepwise-Angle Variation for GI-XRF ("Angle Scan"); 3.6 Energy-Dispersive Detection of X-Rays; 3.6.1 The Semiconductor Detector; 3.6.2 The Silicon Drift Detector; 3.6.3 Position Sensitive Detectors; 3.7 Wavelength-Dispersive Detection of X-Rays; 3.7.1 Dispersing Crystals with Soller Collimators; 3.7.2 Gas-Filled Detectors; 3.7.3 Scintillation Detectors; 3.8 Spectra Registration and Evaluation; 3.8.1 The Registration Unit; 3.8.2 Performance Characteristics; 3.8.2.1 Detector Efficiency; 3.8.2.2 Spectral Resolution3.8.2.3 Input-Output YieldProviding an accessible introduction into the use of Total-Reflection X-ray Fluorescence (TXRF) Analysis, both from a theoretical point of view and for practical applications, this new edition of Total-Reflection X-Ray Fluorescence Analysis is completely updated and enlarged to emphasize new methods and techniques. Written to enable students and scientists to evaluate the suitability of a TXRF method for their specific needs, the text provides an overview to the physical fundamentals and principles of Total-Reflection X-ray Fluorescence (TXRF) Analysis, explains instrumentation and setups, andChemical analysis.Fluorescence spectroscopyX-ray spectroscopyReflectance spectroscopyFluorescence spectroscopy.X-ray spectroscopy.Reflectance spectroscopy.543.56Reinhold Klockenkämper845698Bohlen Alex vonMiAaPQMiAaPQMiAaPQBOOK9910132307903321Total-reflection x-ray fluorescence analysis and related methods1887913UNINA05200nam 22008775 450 991029998940332120251116140216.03-319-08816-510.1007/978-3-319-08816-7(CKB)3710000000311711(EBL)1965371(OCoLC)897810270(SSID)ssj0001408186(PQKBManifestationID)11727557(PQKBTitleCode)TC0001408186(PQKBWorkID)11346130(PQKB)10423422(MiAaPQ)EBC1965371(DE-He213)978-3-319-08816-7(PPN)183148061(EXLCZ)99371000000031171120141203d2014 u| 0engur|n|---|||||txtccrAutomation, Communication and Cybernetics in Science and Engineering 2013/2014 /herausgegeben von Sabina Jeschke, Ingrid Isenhardt, Frank Hees, Klaus Henning1st ed. 2014.Cham :Springer International Publishing :Imprint: Springer,2014.1 online resource (918 p.)Description based upon print version of record.3-319-08815-7 Includes bibliographical references at the end of each chapters.Foreword -- List of Contributors -- Part 1: Agile and Turbulence-Suitable Processes for Knowledge and Technology Intensive Organizations -- Part 2: Next-Generation Teaching and Learning Concepts for Universities and the Economy -- Part 3: Cognitive IT-Supported Processes for Heterogeneous and Cooperative Systems -- Part 4: Target Group-Adapted User Models for Innovation and Technology Development Processes -- Part 5: Semantic Networks and Ontologies for Complex Value Chains and Virtual Environments -- Appendix: Monographs and Published Books from IMA/ZLW & IfU.This book continues the tradition of its predecessors “Automation, Communication and Cybernetics in Science and Engineering 2009/2010 and 2011/2012” and includes a representative selection of scientific publications from researchers at the institute cluster IMA/ZLW & IfU.   IMA - Institute of Information Management in Mechanical Engineering ZLW - Center for Learning and Knowledge Management IfU - Associated Institute for Management Cybernetics e.V. Faculty of Mechanical Engineering, RWTH Aachen University   The book presents a range of innovative fields of application, including: cognitive systems, cyber-physical production systems, robotics, automation technology, machine learning, natural language processing, data mining, predictive data analytics, visual analytics, innovation and diversity management, demographic models, virtual and remote laboratories, virtual and augmented realities, multimedia learning environments, organizational development and management cybernetics. The contributions selected reflect the fundamental paradigm shift toward an increasingly interdisciplinary research world – which has always been both the basis and spirit of the institute cluster IMA/ZLW & IfU.  .Computer scienceMathematicsArtificial intelligenceRoboticsAutomationScienceStudy and teachingCommunicationManagementIndustrial managementComputational Science and Engineeringhttps://scigraph.springernature.com/ontologies/product-market-codes/M14026Artificial Intelligencehttps://scigraph.springernature.com/ontologies/product-market-codes/I21000Robotics and Automationhttps://scigraph.springernature.com/ontologies/product-market-codes/T19020Science Educationhttps://scigraph.springernature.com/ontologies/product-market-codes/O27000Communication Studieshttps://scigraph.springernature.com/ontologies/product-market-codes/X28000Innovation/Technology Managementhttps://scigraph.springernature.com/ontologies/product-market-codes/518000Computer scienceMathematics.Artificial intelligence.Robotics.Automation.ScienceStudy and teaching.Communication.Management.Industrial management.Computational Science and Engineering.Artificial Intelligence.Robotics and Automation.Science Education.Communication Studies.Innovation/Technology Management.004006.3302.2507.1Jeschke Sabinaedthttp://id.loc.gov/vocabulary/relators/edtIsenhardt Ingridedthttp://id.loc.gov/vocabulary/relators/edtHees Frankedthttp://id.loc.gov/vocabulary/relators/edtHenning Klausedthttp://id.loc.gov/vocabulary/relators/edtBOOK9910299989403321Automation, communication and cybernetics in science and engineering 20131409832UNINA