04049nam 22007815 450 991029985300332120200630035521.01-4939-1349-210.1007/978-1-4939-1349-7(CKB)3710000000311456(EBL)1965012(OCoLC)897810230(SSID)ssj0001408104(PQKBManifestationID)11746684(PQKBTitleCode)TC0001408104(PQKBWorkID)11341445(PQKB)10984458(DE-He213)978-1-4939-1349-7(MiAaPQ)EBC1965012(PPN)183147960(EXLCZ)99371000000031145620141203d2015 u| 0engur|n|---|||||txtccrCMOS Test and Evaluation A Physical Perspective /by Manjul Bhushan, Mark B. Ketchen1st ed. 2015.New York, NY :Springer New York :Imprint: Springer,2015.1 online resource (431 p.)Description based upon print version of record.1-4939-1348-4 Includes bibliographical references and index.Introduction -- CMOS Circuit Basics -- CMOS Storage Elements and Synchronous Logic -- IDDQ and Power -- Embedded PVT Monitors -- Variability -- Product Chip Test and Characterization -- Reliability, Burn-In and Guardbands -- Data Analysis and Characterization -- CMOS Metrics and Model Evaluation.This book extends test structure applications described in Microelectronic Test Struc­tures for CMOS Technology (Springer 2011) to digital CMOS product chips. Intended for engineering students and professionals, this book provides a single comprehensive source for evaluating CMOS technology and product test data from a basic knowledge of the physical behavior of the constituent components. Elementary circuits that exhibit key properties of complex CMOS chips are simulated and analyzed, and an integrated view of design, test and characterization is developed. Appropriately designed circuit monitors embedded in the CMOS chip serve to correlate CMOS technology models and circuit design tools to the hardware and also aid in test debug. Impact of silicon process variability, reliability, and power and performance sensitivities to a range of product application conditions are described. Circuit simulations exemplify the methodologies presented, and problems are included at the end of the chapters.ElectronicsMicroelectronicsElectronic circuitsSemiconductorsQuality controlReliabilityIndustrial safetyElectronics and Microelectronics, Instrumentationhttps://scigraph.springernature.com/ontologies/product-market-codes/T24027Circuits and Systemshttps://scigraph.springernature.com/ontologies/product-market-codes/T24068Semiconductorshttps://scigraph.springernature.com/ontologies/product-market-codes/P25150Quality Control, Reliability, Safety and Riskhttps://scigraph.springernature.com/ontologies/product-market-codes/T22032Electronics.Microelectronics.Electronic circuits.Semiconductors.Quality control.Reliability.Industrial safety.Electronics and Microelectronics, Instrumentation.Circuits and Systems.Semiconductors.Quality Control, Reliability, Safety and Risk.537.622620621.381621.3815Bhushan Manjulauthttp://id.loc.gov/vocabulary/relators/aut720769Ketchen Mark Bauthttp://id.loc.gov/vocabulary/relators/autBOOK9910299853003321CMOS Test and Evaluation2505958UNINA