03841nam 22007095 450 991029863900332120251117184631.01-4899-7430-X10.1007/978-1-4899-7430-3(CKB)3710000000212047(EBL)1803053(SSID)ssj0001295482(PQKBManifestationID)11719466(PQKBTitleCode)TC0001295482(PQKBWorkID)11336781(PQKB)10359772(MiAaPQ)EBC1803053(DE-He213)978-1-4899-7430-3(PPN)17992155X(MiAaPQ)EBC6241636(EXLCZ)99371000000021204720140731d2014 u| 0engur|n|---|||||txtccrAtom-Probe Tomography The Local Electrode Atom Probe /by Michael K. Miller, Richard G. Forbes1st ed. 2014.New York, NY :Springer US :Imprint: Springer,2014.1 online resource (437 p.)Description based upon print version of record.1-322-13260-7 1-4899-7429-6 Includes bibliographical references at the end of each chapters and index.Introduction to Atom Probe Tomography -- Introduction to the Physics of Field Ion Emitters -- Field Evaporation and Related Topics -- The Art of Specimen Preparation -- The Local Electrode Atom Probe -- Data Reconstruction -- Data Analysis -- Appendices.This book aims to provide an introduction and overview of atom-probe tomography from a materials science perspective, a full introduction to underlying theory and to current understanding of the theory of laser-pulsed APT, and a careful account of how to prepare specimens, set up the appropriate conditions for tomography, analyse the experimental data, and present results. A special feature of this book is that it includes an updated historical account of the development of the underlying theory (including field evaporation), allowing readers to appreciate how theoretical understanding of the science behind the technique reached its present state.  This book is ideal for:  ·         beginners as well as more experienced researchers and scientists ·         those interested mainly in using the pulsed-laser local electrode atom probe for materials science ·         those interested in developing the technique and understanding the details of how it works.Materials scienceSolid state physicsSpectrum analysisMicroscopyNanotechnologyCharacterization and Evaluation of Materialshttps://scigraph.springernature.com/ontologies/product-market-codes/Z17000Solid State Physicshttps://scigraph.springernature.com/ontologies/product-market-codes/P25013Spectroscopy and Microscopyhttps://scigraph.springernature.com/ontologies/product-market-codes/P31090Nanotechnologyhttps://scigraph.springernature.com/ontologies/product-market-codes/Z14000Materials science.Solid state physics.Spectrum analysis.Microscopy.Nanotechnology.Characterization and Evaluation of Materials.Solid State Physics.Spectroscopy and Microscopy.Nanotechnology.530.41Miller M. K(Michael Kenneth),authttp://id.loc.gov/vocabulary/relators/aut1856525Forbes R(Richard),authttp://id.loc.gov/vocabulary/relators/autBOOK9910298639003321Atom-Probe Tomography4456059UNINA