00699cam2 22002651i 450 99000224467040332120061124121930.0000224467FED01000224467(Aleph)000224467FED0100022446720030910d1991----km-y0itay50------baengGBNitrogen stabilization[by] R. E. Gawley and K. Reinv. 1, P. 459-485001000222787Gawley,Robert E.91685Rein,Kathleen362578ITUNINARICAUNIMARCAN990002244670403321FFABCNitrogen stabilization398318UNINA01303nam 2200385 450 991029645760332120230814230356.01-5386-9466-2(CKB)4100000007213033(WaSeSS)IndRDA00121940(EXLCZ)99410000000721303320200416d2018 uy 0engur|||||||||||txtrdacontentcrdamediacrrdacarrier2018 IEEE 27th Asian Test Symposium 15-18 October 2018, Hefei, China /IEEE Computer SocietyPiscataway, New Jersey :Institute of Electrical and Electronics Engineers,2018.1 online resource (79 pages)1-5386-9467-0 Electronic digital computersTestingCircuitsCongressesElectronic circuitsTestingCongressesFault-tolerant computingCongressesElectronic digital computersTestingCircuitsElectronic circuitsTestingFault-tolerant computing621.3815IEEE Computer Society,WaSeSSWaSeSSPROCEEDING99102964576033212018 IEEE 27th Asian Test Symposium2528000UNINA