01313nam 2200385 450 991028092180332120230814223101.01-5386-6400-3(CKB)4100000005061403(WaSeSS)IndRDA00121944(EXLCZ)99410000000506140320200416d2018 uy 0engur|||||||||||txtrdacontentcrdamediacrrdacarrier2018 IEEE 27th North Atlantic Test Workshop 7-9 May 2018, Essex, VT, USA /Institute of Electrical and Electronics EngineersPiscataway, New Jersey :Institute of Electrical and Electronics Engineers,2018.1 online resource (11 pages)1-5386-6401-1 Embedded computer systemsCongressesRandom access memoryCongressesSystems on a chipTestingCongressesEmbedded computer systemsRandom access memorySystems on a chipTesting004.16Institute of Electrical and Electronics Engineers,WaSeSSWaSeSSPROCEEDING99102809218033212018 IEEE 27th North Atlantic Test Workshop2520717UNINA