02161nam 2200589 450 991027091690332120180119055719.01-118-70715-X1-118-70712-51-118-70714-1(CKB)3710000000894718(PQKBManifestationID)16521834(PQKBWorkID)15049317(PQKB)23995154(MiAaPQ)EBC4714697(DLC) 2016033086(EXLCZ)99371000000089471820170104h20172017 uy 0engurcnu||||||||txtccrESD testing from components to systems /Steven H. VoldmanChichester, West Sussex, England :Wiley,2017.©20171 online resource (324 pages) illustrationsESD seriesBibliographic Level Mode of Issuance: Monograph0-470-51191-5 Includes bibliographical references at the end of each chapters and index.Human body model -- Machine model -- Charged device model -- Transmission line pulse (TLP) -- Very fast transmission line pulse (VF-TLP) -- IEC 61000-4-2 -- Human metal model (HMM) -- IEC 61000-4-5 -- Cable discharge event (CDE) -- Latchup -- Electrical overstress (EOS) -- Electromagnetic compatibility (EMC) testing.Electronic circuitsEffect of radiation onElectronic apparatus and appliancesTestingElectric dischargesDetectionElectric dischargesMeasurementElectrostaticsElectronic books.Electronic circuitsEffect of radiation on.Electronic apparatus and appliancesTesting.Electric dischargesDetection.Electric dischargesMeasurement.Electrostatics.621.3815/4Voldman Steven H.872423MiAaPQMiAaPQMiAaPQBOOK9910270916903321ESD testing2781095UNINA