01307nam 2200361 450 991021997630332120230802003031.00-8330-7987-5(CKB)3360000000476885(WaSeSS)IndRDA00120507(EXLCZ)99336000000047688520200603d2012 uy 0engur|||||||||||txtrdacontentcrdamediacrrdacarrierAn assessment of the assignments and arrangements of the executive agent for DoD biometrics and status report on the DoD biometrics enterprise /Douglas Shontz [and three others]Santa Monica, California :RAND Corporation,2012.1 online resource (104 pages)0-8330-7707-4 Biometric identificationUnited StatesIdentificationAutomationBiometric identificationIdentificationAutomation.355.61Shontz Douglas1267045WaSeSSWaSeSSBOOK9910219976303321An assessment of the assignments and arrangements of the executive agent for DoD biometrics and status report on the DoD biometrics enterprise2979230UNINA02597nam 2200541 a 450 991079145710332120230617011757.01-907747-89-3(CKB)2560000000050276(EBL)677902(OCoLC)703156093(SSID)ssj0000474604(PQKBManifestationID)12164730(PQKBTitleCode)TC0000474604(PQKBWorkID)10454569(PQKB)11291738(MiAaPQ)EBC677902(EXLCZ)99256000000005027620040608d2004 uy 0engur|n|---|||||txtccrX-ray and electron diffraction studies in materials science[electronic resource] /D.J. DysonLondon Maney for the Institute of Materials, Minerals, and Miningc20041 online resource (376 p.)Description based upon print version of record.1-902653-74-2 Includes bibliographical references and index.Contents; INDEX; Foreword; REAL SPACE; CRYSTAL CHEMISTRY; THE INTENSITY OF DIFFRACTION; THE STEREOGRAPHIC PROJECTION; INSTRUMENT CONSIDERATIONS; LINE PROFILES; dS AND IS - PHASE IDENTIFICATION; QUANTITATIVE ANALYSIS; CRYSTALLITE SIZE ANALYSIS; THIN LAYERS; CRYSTALLOGRAPHIC TEXTURE; ELECTRON DIFFRACTION AND ITS RELATION TO XRD; APPENDIX - lA; APPENDIX - IBX-ray diffraction was first applied almost a century ago. The subsequent development of the technique and its application across industry and academia to physical, chemical and biological problems has made it an important tool in the armoury of the analyst. Much of he early work developed the basic theory and much of this is still relevant today. These early years saw the publication of some extremely good texts on the subject. Much of what is presented in these is still applicable; many of them however are no longer in print. More recent times have seen the emergence of diffractometry an contElectronsDiffractionX-raysCrystallographyElectronsDiffraction.X-rays.Crystallography.620.11295Dyson D. J(David John)19732Institute of Materials, Minerals, and Mining.MiAaPQMiAaPQMiAaPQBOOK9910791457103321X-ray and electron diffraction studies in materials science3781184UNINA