02426nam 2200397 450 991021987960332120230419112901.01-5386-0352-7(CKB)4340000000130449(NjHacI)994340000000130449(EXLCZ)99434000000013044920230419d2017 uy 0engur|||||||||||txtrdacontentcrdamediacrrdacarrier2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS) /Institute of Electrical and Electronics Engineers ; Panepistēmio Athēnōn, contributorPiscataway, N.J. :IEEE,2017.1 online resource illustrations1-5386-0353-5 Includes bibliographical references.On line testing and more generally design for robustness, are important in modern electronic systems. These needs increased dramatically with the introduction of nanometer technologies, which impact adversely noise margins process, voltage and temperature variations aging and wear out soft error and EMI sensitivity and power density and make mandatory the use of design for robustness techniques for extending, yield, reliability, and lifetime of modern SoCs Design for reliability is also mandatory for reducing power dissipation, as reducing voltage for reducing power strongly affects reliability by reducing noise margins and thus the sensitivity to soft errors and EMI, and by increasing circuit delays which increase sensitivity to timing faults Design for Security is also strongly related with Design for Reliability, as security attacks are often fault based IOLTS is an established forum for presenting novel ideas and experimental data on these areas.2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design Electronic circuit designCongressesError-correcting codes (Information theory)Electronic circuit designError-correcting codes (Information theory)621.3815Athēnōn PanepistēmioNjHacINjHaclPROCEEDING99102198796033212017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS)2513248UNINA