01307nam 2200349 450 991020934950332120230421080357.01-5386-0415-9(CKB)3710000001402935(NjHacI)993710000001402935(EXLCZ)99371000000140293520230421d2017 uy 0engur|||||||||||txtrdacontentcrdamediacrrdacarrier2017 18th IEEE Latin American Test Symposium (LATS) /Institute of Electrical and Electronics Engineers (IEEE) StaffPiscataway, New Jersey :Institute of Electrical and Electronics Engineers (IEEE),2017.1 online resource illustrations1-5386-0416-7 System, board, and component testing and fault tolerance with design, manufacturing and field considerations.2017 18th IEEE Latin American Test Symposium Electronic apparatus and appliancesTestingCongressesElectronic apparatus and appliancesTesting621.3810287NjHacINjHaclPROCEEDING99102093495033212017 18th IEEE Latin American Test Symposium (LATS)2530276UNINA