01190nam0-2200397li-450 99000026000020331620180312154727.03-540-58541-90026000USA010026000(ALEPH)000026000USA0100260002001998111996-------y0itay0103----baengUSMicrodosimetry and its applicationsH. H. Rossi, M. ZaiderBerlin [etc.]Springer-Verlagcopyr. 1996XII, 321 p.ill.24 cmbiofisicadosimetriaradiobiologia61201448radiazioneRossi,H. H.746662Zaider,M.Sistema bibliotecario di Ateneo dell' Università di SalernoRICA990000260000203316612.014 48 ROS22495/CBS612.014 4800326627BKSCI1998111920001110USA01171520020403USA011634PATRY9020040406USA011619RSIAV69020090901USA010923Microdosimetry and its applications1490713UNISA01204oam 2200397zu 450 991016475460332120210807002122.00-8031-5963-3(CKB)3170000000044642(SSID)ssj0001490220(PQKBManifestationID)11836941(PQKBTitleCode)TC0001490220(PQKBWorkID)11473704(PQKB)10052514(NjHacI)993170000000044642(EXLCZ)99317000000004464220160829d1961 uy engur|||||||||||txtccrMaterials and Electron Device Processing[Place of publication not identified]American Society for Testing & Materials19611 online resource (viii, 238 pages)Bibliographic Level Mode of Issuance: Monograph0-8031-6117-4 ElectronicsMaterialsElectronicsMaterials.512.10246213Standing S946511PQKBBOOK9910164754603321Materials and Electron Device Processing2138381UNINA