01635oam 2200493zu 450 991016469700332120210807002116.00-8031-4983-2(CKB)3170000000045323(SSID)ssj0001184130(PQKBManifestationID)11639828(PQKBTitleCode)TC0001184130(PQKBWorkID)11190258(PQKB)10996554(EXLCZ)99317000000004532320160829d1986 uy engtxtccrCase histories involving fatigue and fracture mechanics : a symposium[Place of publication not identified]ASTM1986ASTM special technical publication Case histories involving fatigue and fracture mechanics Bibliographic Level Mode of Issuance: Monograph0-8031-0485-5 MetalsFatigueCongressesFracture mechanicsCongressesChemical & Materials EngineeringHILCCEngineering & Applied SciencesHILCCMaterials ScienceHILCCMetalsFatigueFracture mechanicsChemical & Materials EngineeringEngineering & Applied SciencesMaterials Science620.1/126Rich Thomas PHudson C. MASTM Committee E-24 on Fracture TestingPQKBBOOK9910164697003321Case histories involving fatigue and fracture mechanics : a symposium2145432UNINA01904oas 22006253 450 991062615490332120260127110104.02379-6782(DE-599)ZDB2561971-8(OCoLC)665171277(CONSER) 2015201201(CKB)110992357337776(DE-599)2561971-8(EXLCZ)9911099235733777619800109b19631964 oy aengur|||||||||||txtrdacontentcrdamediacrrdacarrierIEEE transactions on applications and industryNew York, N.Y. :Institute of Electrical and Electronics Engineers,c1963-c1965.0536-1524 Institute of Electrical and Electronics Engineers transactions on applications and industryI.E.E.E. transactions on applications and industryTransactions on applications and industryApplications and industryIEEE trans. appl. ind.Electrical engineeringPeriodicalsElectrical engineeringfast(OCoLC)fst01728596Periodicals.fastElectrical engineeringElectrical engineering.621.3/05Institute of Electrical and Electronics EngineersInstitute of Electrical and Electronics Engineers.Technical Operations Committee.NzUX1TXAOCLCQOCLCFGPMOCLCODLCOCLCAAU@UKMGBU3WNJTBWNOCLCLJOURNAL9910626154903321IEEE transactions on applications and industry796239UNINA