01678oam 2200505zu 450 991016428950332120210807002203.00-8031-5389-9(CKB)3170000000044295(SSID)ssj0001184356(PQKBManifestationID)11685061(PQKBTitleCode)TC0001184356(PQKBWorkID)11191780(PQKB)10987769(EXLCZ)99317000000004429520160829d1998 uy engtxtccrRecombination lifetime measurements in silicon[Place of publication not identified]ASTM1998Bibliographic Level Mode of Issuance: Monograph0-8031-2489-9 SemiconductorsTestingCongressesService life (Engineering)CongressesForecastingElectronic measurementsCongressesElectrical & Computer EngineeringHILCCEngineering & Applied SciencesHILCCElectrical EngineeringHILCCSemiconductorsTestingCongressesService life (Engineering)CongressesForecastingElectronic measurementsCongressesElectrical & Computer EngineeringEngineering & Applied SciencesElectrical Engineering621.3815/2Hughes William M.1948-Bacher Fred RGupta D. CPQKBBOOK9910164289503321Recombination lifetime measurements in silicon1988075UNINA