00843nam0-22003011i-450-990003152110403321000315211FED01000315211(Aleph)000315211FED0100031521120000920d--------km-y0itay50------baitaIT<<The >>Patent Paradox RevisitedDeterminants of Patenting in the US Semiconductor Industry, 1980-94Bronwyn H. Hall, Rose Marie HamWorking paper seriesNBER7062F/1.221G/1.4H/2.2243Hall,Bronwyn H.Ham,Rose MarieITUNINARICAUNIMARCBK990003152110403321PaperSESSESPatent Paradox Revisited458294UNINAING0101175oam 2200397zu 450 991016426980332120210807002217.00-8031-6015-1(CKB)3170000000044746(SSID)ssj0001489714(PQKBManifestationID)11878131(PQKBTitleCode)TC0001489714(PQKBWorkID)11458728(PQKB)10920348(NjHacI)993170000000044746(EXLCZ)99317000000004474620160829d1966 uy engur|||||||||||txtccrDurability of Adhesive Joints[Place of publication not identified]American Society for Testing & Materials19661 online resource illustrationsBibliographic Level Mode of Issuance: Monograph0-8031-6169-7 Includes bibliographical references.Adhesive jointsAdhesive joints.660.2PQKBBOOK9910164269803321Durability of Adhesive Joints2206676UNINA