01402oam 2200457zu 450 991016426620332120210807002230.00-8031-4575-6(CKB)3170000000044782(SSID)ssj0001489795(PQKBManifestationID)11850571(PQKBTitleCode)TC0001489795(PQKBWorkID)11459358(PQKB)11071382(NjHacI)993170000000044782(EXLCZ)99317000000004478220160829d1968 uy engur|||||||||||txtccrElectron Fractography[Place of publication not identified]American Society for Testing & Materials19681 online resource (230 pages) illustrationsASTM special technical publication, ;436Bibliographic Level Mode of Issuance: Monograph0-8031-4497-0 Includes bibliographical references.ASTM special technical publication ;436.FractographyElectron microscopesFractography.Electron microscopes.669.950282Beachem C. D922748PQKBBOOK9910164266203321Electron Fractography2206669UNINA