03711nam 22006735 450 991015529950332120200702123915.010.1007/978-3-319-48875-2(CKB)3710000000964825(DE-He213)978-3-319-48875-2(MiAaPQ)EBC4751757(iGPub)SPNA0045491(PPN)197456723(EXLCZ)99371000000096482520161201d2017 u| 0engurnn|008mamaatxtrdacontentcrdamediacrrdacarrierAdvances in Reliability and System Engineering /edited by Mangey Ram, J. Paulo Davim1st ed. 2017.Cham :Springer International Publishing :Imprint: Springer,2017.1 online resource (XII, 265 p. 86 illus., 53 illus. in color.) Management and Industrial Engineering,2365-05323-319-48874-0 3-319-48875-9 Includes bibliographical references at the end of each chapters.Reliability measures, reliability assessment of multi-state systems -- System Engineering -- Reliability Modeling and Testing for Complex Systems -- Optimization of multi-state systems Continuous multi-state systems -- Standby multi-state systems -- New computational techniques applied to multi-state systems -- Mathematical Modelling & Simulation -- System reliability improvement and preventive maintenance based on component degradation -- Probabilistic and non-probabilistic safety assessment -- monitoring and control for multi-stage systems -- Engineering design for safety and reliability -- Statistical process control -- System modelling.This book presents original studies describing the latest research and developments in the area of reliability and systems engineering. It helps the reader identifying gaps in the current knowledge and presents fruitful areas for further research in the field. Among others, this book covers reliability measures, reliability assessment of multi-state systems, optimization of multi-state systems, continuous multi-state systems, new computational techniques applied to multi-state systems and probabilistic and non-probabilistic safety assessment.Management and Industrial Engineering,2365-0532Quality controlReliabilityIndustrial safetyElectronic circuitsApplied mathematicsEngineering mathematicsQuality Control, Reliability, Safety and Riskhttps://scigraph.springernature.com/ontologies/product-market-codes/T22032Circuits and Systemshttps://scigraph.springernature.com/ontologies/product-market-codes/T24068Mathematical and Computational Engineeringhttps://scigraph.springernature.com/ontologies/product-market-codes/T11006Quality control.Reliability.Industrial safety.Electronic circuits.Applied mathematics.Engineering mathematics.Quality Control, Reliability, Safety and Risk.Circuits and Systems.Mathematical and Computational Engineering.620.00452Ram Mangeyedthttp://id.loc.gov/vocabulary/relators/edtDavim J. Pauloedthttp://id.loc.gov/vocabulary/relators/edtMiAaPQMiAaPQMiAaPQBOOK9910155299503321Advances in Reliability and System Engineering2281454UNINA