01157nam 2200349 450 991014723070332120231206041457.0(CKB)1000000000035428(NjHacI)991000000000035428(EXLCZ)99100000000003542820231206d2004 uy 0engur|||||||||||txtrdacontentcrdamediacrrdacarrier IEEE standard for test methods for the characterization of organic transistors and materials /Institute of Electrical and Electronics EngineersNew York, NY :IEEE,2004.1 online resource (vi, 13 pages)0-7381-3993-9 IEEE Std 1620-2004Field-effect transistorsOrganic semiconductorsField-effect transistors.Organic semiconductors.621.3815284NjHacINjHaclDOCUMENT9910147230703321IEEE standard for test methods for the characterization of organic transistors and materials3647087UNINA