01709oam 2200493zu 450 991014682970332120210806235803.01-5090-9767-8(CKB)1000000000022601(SSID)ssj0000396666(PQKBManifestationID)12120027(PQKBTitleCode)TC0000396666(PQKBWorkID)10334531(PQKB)11539136(EXLCZ)99100000000002260120160829d2005 uy engtxtccr2005 IEEE International Test Conference (ITC) : 8-10 November, 2005, Austin, TX[Place of publication not identified]Institute of Electrical and Electronics Engineers2005Bibliographic Level Mode of Issuance: Monograph0-7803-9038-5 Integrated circuitsTestingCongressesSemiconductorsTestingCongressesElectronicsCongressesElectrical EngineeringHILCCElectrical & Computer EngineeringHILCCEngineering & Applied SciencesHILCCIntegrated circuitsTestingSemiconductorsTestingElectronicsElectrical EngineeringElectrical & Computer EngineeringEngineering & Applied Sciences621.3815/48Institute of Electrical and Electronics EngineersInternational Test ConferencePQKBPROCEEDING99101468297033212005 IEEE International Test Conference (ITC) : 8-10 November, 2005, Austin, TX2382075UNINA