01766oam 2200517zu 450 991014682970332120241212215319.097815090976781509097678(CKB)1000000000022601(SSID)ssj0000396666(PQKBManifestationID)12120027(PQKBTitleCode)TC0000396666(PQKBWorkID)10334531(PQKB)11539136(EXLCZ)99100000000002260120160829d2005 uy engtxtccr2005 IEEE International Test Conference (ITC) : 8-10 November, 2005, Austin, TX[Place of publication not identified]Institute of Electrical and Electronics Engineers2005Bibliographic Level Mode of Issuance: Monograph9780780390386 0780390385 Integrated circuitsTestingCongressesSemiconductorsTestingCongressesElectronicsCongressesElectrical EngineeringHILCCElectrical & Computer EngineeringHILCCEngineering & Applied SciencesHILCCIntegrated circuitsTestingSemiconductorsTestingElectronicsElectrical EngineeringElectrical & Computer EngineeringEngineering & Applied Sciences621.3815/48Institute of Electrical and Electronics Engineers,International Test Conference.PQKBPROCEEDING99101468297033212005 IEEE International Test Conference (ITC) : 8-10 November, 2005, Austin, TX2382075UNINA