01888oam 2200481zu 450 991014669130332120210807002838.01-5090-8857-1(CKB)1000000000524994(SSID)ssj0000393964(PQKBManifestationID)12091969(PQKBTitleCode)TC0000393964(PQKBWorkID)10379728(PQKB)10822380(EXLCZ)99100000000052499420160829d2007 uy engtxtccrDFT 2007 : 22nd IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems : proceedings : 26-28 September, 2007, Rome, Italy[Place of publication not identified]IEEE Computer Society Press2007Bibliographic Level Mode of Issuance: Monograph0-7695-2885-6 Integrated circuitsDesign and constructionVery large scale integrationCongressesFault-tolerant computingCongressesElectrical & Computer EngineeringHILCCElectrical EngineeringHILCCEngineering & Applied SciencesHILCCIntegrated circuitsDesign and constructionVery large scale integrationFault-tolerant computingElectrical & Computer EngineeringElectrical EngineeringEngineering & Applied Sciences621.39/5Bolchini CristianaIEEE Computer SocietyIEEE International Symposium on Defect and Fault Tolerance in VLSI SystemsPQKBPROCEEDING9910146691303321DFT 2007 : 22nd IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems : proceedings : 26-28 September, 2007, Rome, Italy2357283UNINA