01614oam 2200421zu 450 991014645740332120241212215308.097815090977391509097732(CKB)1000000000022576(SSID)ssj0000395392(PQKBManifestationID)12081925(PQKBTitleCode)TC0000395392(PQKBWorkID)10450558(PQKB)11136093(EXLCZ)99100000000002257620160829d2005 uy engtxtccr2005 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Conference Center, S. Lake Tahoe, California, October 17-20, 2005[Place of publication not identified]IEEE Electron Devices Society2005Bibliographic Level Mode of Issuance: Monograph9780780389922 0780389921 Integrated circuitsReliabilityCongressesIntegrated circuitsReliabilityWafer-scale integrationCongressesIntegrated circuitsReliabilityIntegrated circuitsReliabilityWafer-scale integrationIEEE Reliability SocietyIEEE Electron Devices SocietyInternational Integrated Reliability WorkshopPQKBPROCEEDING99101464574033212005 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Conference Center, S. Lake Tahoe, California, October 17-20, 20052539079UNINA